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题名

Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film

作者
通讯作者Wang, Dongbo; Chen, Lang
发表日期
2022-07-01
DOI
发表期刊
EISSN
2072-666X
卷号13期号:7
摘要
High Mg content (60%) ZnMgO samples with and without Ga dope were grown by an RF magnetron sputtering system. The effect of Ga dope on the ZnMgO sample and the respective ultraviolet photodetectors (UVPD) device's performance were carefully studied by various experimental methods. The investigations of the structure and optical properties of the ZnMgO sample established that the Ga doped sample has a better crystal quality and larger band gap (5.54 eV). The current-voltage characteristics indicate that both the photocurrent and dark current were enhanced after Ga dope. Under 12 V bias, the undoped UVPD show two spectral response peaks at 244 nm and 271 nm with a responsivity of 1.9 A/W and 0.38 A/W, respectively. While the Ga doped UVPD showed only one response peak at 241 nm and the deep UV responsibility up to 8.9 A/W;, as the bias increased from 12 V to 60 V, the responsiveness raised to 52 A/W, with a signal to noise ratio (241 nm/700 nm) as high as 10(5). Combining the results of XRD, PL spectrum and XPS, the enhanced ultraviolet photoresponse of the Ga dope device contributed to improving the crystal quality and "dopant-defect pairing effect" caused by Ga doping, which led to a considerable reduction in the number of ionized impurities in the scatting centers, and enhanced the carrier's mobility. Our work demonstrates that even a high Mg content ZnMgO can exhibit enhanced UV performance after a Ga dope due to the dopant-defect pairing effect, which confirmed the advantage of the use of ZnMgO in the deep-UV region.
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
Science and Technology Research Items of Shenzhen["JCYJ20180504165650580","JCYJ20190809142603695"]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS类目
Chemistry, Analytical ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied
WOS记录号
WOS:000834477000001
出版者
EI入藏号
20223612702073
EI主题词
Crystal impurities ; Crystal structure ; Current voltage characteristics ; Defects ; Energy gap ; Gallium ; Magnesium ; Magnetron sputtering ; Optical properties ; Semiconductor doping
EI分类号
Magnesium and Alloys:542.2 ; Alkaline Earth Metals:549.2 ; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3 ; Semiconducting Materials:712.1 ; Light/Optics:741.1 ; Crystal Lattice:933.1.1 ; Materials Science:951
来源库
Web of Science
引用统计
被引频次[WOS]:3
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/370411
专题理学院_物理系
作者单位
1.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Peoples R China
2.Harbin Inst Technol, Sch Mat Sci & Engn, Dept Optoelect Informat Sci, Harbin 150001, Peoples R China
第一作者单位物理系
通讯作者单位物理系
第一作者的第一单位物理系
推荐引用方式
GB/T 7714
Ye, Mao,Wang, Dongbo,Jiao, Shujie,et al. Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film[J]. MICROMACHINES,2022,13(7).
APA
Ye, Mao,Wang, Dongbo,Jiao, Shujie,&Chen, Lang.(2022).Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film.MICROMACHINES,13(7).
MLA
Ye, Mao,et al."Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film".MICROMACHINES 13.7(2022).
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