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题名

Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon

作者
通讯作者Deng, Hui
发表日期
2022-09-01
DOI
发表期刊
ISSN
1948-7185
卷号13期号:36
摘要
Atomic-scale smooth surfaces of single-crystal silicon (Si) are indispensable for cutting-edge applications, such as semiconductor chips, quantum devices, and X-ray optics. Here, we vary the CF4/O-2 reactant gas ratio to tune the etching mode from isotropic and orientation-selective etching to atom-selective etching in an atmospheric inductively coupled plasma (ICP). At low CF4/O-2 ratios, the diffusion of the etching species dominates, resulting in isotropic etching. By contrast, the kinetics of ICP etching becomes dominant upon increasing the CF4/O-2 ratio to between 1:1 and 2:1, inducing orientation-selective etching. Notably, CF4/O-2 ratios above 2:1 result in atom-selective etching, whereby atoms around rough surface sites can be selectively removed. The atom-selective etching mode was used to achieve an atomically smooth surface with a S-a roughness of 0.14 nm. The results of this study demonstrate that atom-selective etching is an efficient and effective approach for manufacturing Si atomic surfaces.
相关链接[来源记录]
收录类别
语种
英语
重要成果
NI论文
学校署名
第一 ; 通讯
资助项目
National Natural Science Foundation of China["52005243","52035009"] ; Science and Technology Innovation Committee of Shen z h e n Municipality["JCYJ20200109141003910","JCYJ20210324120402007"]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Atomic, Molecular & Chemical
WOS记录号
WOS:000853774800001
出版者
来源库
Web of Science
引用统计
被引频次[WOS]:8
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/402342
专题工学院_机械与能源工程系
作者单位
Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Guangdong, Peoples R China
第一作者单位机械与能源工程系
通讯作者单位机械与能源工程系
第一作者的第一单位机械与能源工程系
推荐引用方式
GB/T 7714
Wu, Bing,Zhang, Yi,Yi, Rong,et al. Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon[J]. Journal of Physical Chemistry Letters,2022,13(36).
APA
Wu, Bing,Zhang, Yi,Yi, Rong,&Deng, Hui.(2022).Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon.Journal of Physical Chemistry Letters,13(36).
MLA
Wu, Bing,et al."Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon".Journal of Physical Chemistry Letters 13.36(2022).
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