题名 | Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon |
作者 | |
通讯作者 | Deng, Hui |
发表日期 | 2022-09-01
|
DOI | |
发表期刊 | |
ISSN | 1948-7185
|
卷号 | 13期号:36 |
摘要 | Atomic-scale smooth surfaces of single-crystal silicon (Si) are indispensable for cutting-edge applications, such as semiconductor chips, quantum devices, and X-ray optics. Here, we vary the CF4/O-2 reactant gas ratio to tune the etching mode from isotropic and orientation-selective etching to atom-selective etching in an atmospheric inductively coupled plasma (ICP). At low CF4/O-2 ratios, the diffusion of the etching species dominates, resulting in isotropic etching. By contrast, the kinetics of ICP etching becomes dominant upon increasing the CF4/O-2 ratio to between 1:1 and 2:1, inducing orientation-selective etching. Notably, CF4/O-2 ratios above 2:1 result in atom-selective etching, whereby atoms around rough surface sites can be selectively removed. The atom-selective etching mode was used to achieve an atomically smooth surface with a S-a roughness of 0.14 nm. The results of this study demonstrate that atom-selective etching is an efficient and effective approach for manufacturing Si atomic surfaces. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
重要成果 | NI论文
|
学校署名 | 第一
; 通讯
|
资助项目 | National Natural Science Foundation of China["52005243","52035009"]
; Science and Technology Innovation Committee of Shen z h e n Municipality["JCYJ20200109141003910","JCYJ20210324120402007"]
|
WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
; Physics
|
WOS类目 | Chemistry, Physical
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Atomic, Molecular & Chemical
|
WOS记录号 | WOS:000853774800001
|
出版者 | |
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:8
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/402342 |
专题 | 工学院_机械与能源工程系 |
作者单位 | Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Guangdong, Peoples R China |
第一作者单位 | 机械与能源工程系 |
通讯作者单位 | 机械与能源工程系 |
第一作者的第一单位 | 机械与能源工程系 |
推荐引用方式 GB/T 7714 |
Wu, Bing,Zhang, Yi,Yi, Rong,et al. Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon[J]. Journal of Physical Chemistry Letters,2022,13(36).
|
APA |
Wu, Bing,Zhang, Yi,Yi, Rong,&Deng, Hui.(2022).Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon.Journal of Physical Chemistry Letters,13(36).
|
MLA |
Wu, Bing,et al."Tuning the Plasma Etching Mode for the Atomic-Scale Smoothing of Single-Crystal Silicon".Journal of Physical Chemistry Letters 13.36(2022).
|
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