题名 | Full Color Quantum Dot Light-Emitting Diodes Patterned by Photolithography Technology |
作者 | |
通讯作者 | Chen,Shuming |
DOI | |
发表日期 | 2018
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ISSN | 0097-966X
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EISSN | 2168-0159
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会议录名称 | |
卷号 | 49
|
期号 | 1
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页码 | 973-976
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摘要 | Photolithography is a high resolution and mature patterning technique which has been widely used in semiconductor industry. For display application, a pixel consists of red (R), green (G) and blue (B) side-by-side sub-pixels, which thereby requires a high resolution patterning of the light-emission layers. In this work, photolithography is used to fine pattern the quantum dot (QD) light-emitting layers. To prevent the QDs being washed off during the lift-off process, the ZnMgO layer is treated by the hydrophobic material hexamethyldisilazane (HMDS). With HMDS treatment, the adhesion between the QDs and the ZnMgO is effectively improved. As a result, side-by-side RGB QD with pixel size 30 μm × 120 μm is successfully achieved. After patterning, the R, G and B QLEDs exhibit a maximum current efficiency of 11.6 cd/A, 29.7 cd/A and 1.5 cd/A, respectively. |
关键词 | |
学校署名 | 第一
; 通讯
|
语种 | 英语
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相关链接 | [Scopus记录] |
Scopus记录号 | 2-s2.0-85072110776
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:0
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/402806 |
专题 | 工学院_电子与电气工程系 |
作者单位 | Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Ji,Tingjing,Jin,Shuang,Chen,Bingwei,et al. Full Color Quantum Dot Light-Emitting Diodes Patterned by Photolithography Technology[C],2018:973-976.
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条目包含的文件 | 条目无相关文件。 |
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