Secure Rate-Splitting for MIMO Broadcast Channel with Imperfect CSIT and a Jammer

Zhang, Tong1; Chen, Dongsheng1; Li, Na2; Zhuang, Yufan1; Lv, Bojie1; Wang, Rui1

10.1109/WOCC55104.2022.9880604

2022

31st Wireless and Optical Communications Conference (WOCC)

2379-1268

978-1-6654-6951-7

2022 31ST WIRELESS AND OPTICAL COMMUNICATIONS CONFERENCE (WOCC)

24-29

AUG 11-12, 2022

null,Shenzhen,PEOPLES R CHINA

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

In this paper, we investigate the secure rate-splitting for the two-user multiple-input multiple-output (MIMO) broadcast channel with imperfect channel state information at the transmitter (CSIT) and a multiple-antenna jammer, where each receiver has an equal number of antennas and the jammer has perfect channel state information (CSI). Specifically, we design a secure rate-splitting multiple-access strategy, where the security of split private and common messages is ensured by precoder design with joint nulling and aligning the leakage information, regarding different antenna configurations. Moreover, we show that the sum-secure degrees-of-freedom (SDoF) achieved by secure rate-splitting is optimal and outperforms that by conventional zero-forcing. Therefore, we reveal the sum-SDoF of the two-user MIMO broadcast channel with imperfect CSIT and a jammer, and validate the superiority of rate-splitting for the security purpose in this scenario with emphasis of MIMO.

Broadcast channel MIMO rate-splitting imperfect CSIT secure degrees of freedom

第一 ; 通讯

英语

CPCI-S

Computer Science ; Engineering ; Optics ; Telecommunications

Computer Science, Theory & Methods ; Engineering, Electrical & Electronic ; Optics ; Telecommunications

WOS:000861723500005

Web of Science

1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen, Peoples R China
2.Beijing Univ Posts & Telecommun, Natl Engn Lab Mobile Network Technol, Beijing, Peoples R China

Zhang, Tong,Chen, Dongsheng,Li, Na,et al. Secure Rate-Splitting for MIMO Broadcast Channel with Imperfect CSIT and a Jammer[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2022:24-29.