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题名

Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering

作者
通讯作者Wang,Qing; Yu,Hongyu
发表日期
2023-02-01
DOI
发表期刊
ISSN
1369-8001
EISSN
1873-4081
卷号154
摘要
In this study, magnetron reactive sputtering using a copper oxide target was performed to obtain a series of high-quality CuO films with high hole concentration. The results of X-ray photoelectron spectroscopy and Hall measurements revealed that the hole concentration exhibited a negative correlation to the Cu to Cu ratio in the p-type CuO film. This phenomenon indicated that the hole concentration can be modulated by adjusting film deposition conditions. Considering the high hole concentration and fine surface quality, these CuO films were used as p-type gates without gate etching and positively shifted the threshold voltage (V) of AlGaN/GaN high-electron-mobility transistors (HEMTs). This study is the first to achieve quasi-normally off GaN HEMTs using CuO gates, in which V positively shifted approximately 2.5 V and reached 0.5 V. Because of the excellent surface quality of the CuO gate, the off-state current and gate leakage current of GaN HEMTs improved considerably. This study verified that CuO is a promising gate candidate for fabricating low-cost, normally off AlGaN/GaN HEMTs.
关键词
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
National Natural Science Foundation of China[62274082];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20200109141233476];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20210324120409025];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20220530115411025];
WOS研究方向
Engineering ; Materials Science ; Physics
WOS类目
Engineering, Electrical & Electronic ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号
WOS:000908381500005
出版者
EI入藏号
20224713150467
EI主题词
Aluminum gallium nitride ; Copper oxides ; Electron mobility ; Etching ; Gallium nitride ; High electron mobility transistors ; Hole concentration ; III-V semiconductors ; Leakage currents ; Oxide films ; Semiconductor doping ; Surface properties ; X ray photoelectron spectroscopy
EI分类号
Electricity: Basic Concepts and Phenomena:701.1 ; Semiconducting Materials:712.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Chemical Reactions:802.2 ; Inorganic Compounds:804.2 ; Physical Properties of Gases, Liquids and Solids:931.2 ; Materials Science:951
ESI学科分类
MATERIALS SCIENCE
Scopus记录号
2-s2.0-85142176334
来源库
Scopus
引用统计
被引频次[WOS]:2
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/412533
专题工学院_深港微电子学院
作者单位
1.School of Microelectronics,Southern University of Science and Technology,Shenzhen,518055,China
2.Engineering Research Center of Integrated Circuits for Next-Generation Communications,Ministry of Education,Southern University of Science and Technology,Shenzhen,518055,China
3.School of Microelectronics,Fudan University,Shanghai,200433,China
第一作者单位深港微电子学院
通讯作者单位深港微电子学院;  南方科技大学
第一作者的第一单位深港微电子学院
推荐引用方式
GB/T 7714
Lu,Honghao,Wen,Kangyao,Du,Fangzhou,et al. Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering[J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,2023,154.
APA
Lu,Honghao.,Wen,Kangyao.,Du,Fangzhou.,Tang,Chuying.,Cheng,Wei Chih.,...&Yu,Hongyu.(2023).Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,154.
MLA
Lu,Honghao,et al."Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering".MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 154(2023).
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