题名 | Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering |
作者 | |
通讯作者 | Wang,Qing; Yu,Hongyu |
发表日期 | 2023-02-01
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DOI | |
发表期刊 | |
ISSN | 1369-8001
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EISSN | 1873-4081
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卷号 | 154 |
摘要 | In this study, magnetron reactive sputtering using a copper oxide target was performed to obtain a series of high-quality CuO films with high hole concentration. The results of X-ray photoelectron spectroscopy and Hall measurements revealed that the hole concentration exhibited a negative correlation to the Cu to Cu ratio in the p-type CuO film. This phenomenon indicated that the hole concentration can be modulated by adjusting film deposition conditions. Considering the high hole concentration and fine surface quality, these CuO films were used as p-type gates without gate etching and positively shifted the threshold voltage (V) of AlGaN/GaN high-electron-mobility transistors (HEMTs). This study is the first to achieve quasi-normally off GaN HEMTs using CuO gates, in which V positively shifted approximately 2.5 V and reached 0.5 V. Because of the excellent surface quality of the CuO gate, the off-state current and gate leakage current of GaN HEMTs improved considerably. This study verified that CuO is a promising gate candidate for fabricating low-cost, normally off AlGaN/GaN HEMTs. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | National Natural Science Foundation of China[62274082];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20200109141233476];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20210324120409025];Science, Technology and Innovation Commission of Shenzhen Municipality[JCYJ20220530115411025];
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WOS研究方向 | Engineering
; Materials Science
; Physics
|
WOS类目 | Engineering, Electrical & Electronic
; Materials Science, Multidisciplinary
; Physics, Applied
; Physics, Condensed Matter
|
WOS记录号 | WOS:000908381500005
|
出版者 | |
EI入藏号 | 20224713150467
|
EI主题词 | Aluminum gallium nitride
; Copper oxides
; Electron mobility
; Etching
; Gallium nitride
; High electron mobility transistors
; Hole concentration
; III-V semiconductors
; Leakage currents
; Oxide films
; Semiconductor doping
; Surface properties
; X ray photoelectron spectroscopy
|
EI分类号 | Electricity: Basic Concepts and Phenomena:701.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Chemical Reactions:802.2
; Inorganic Compounds:804.2
; Physical Properties of Gases, Liquids and Solids:931.2
; Materials Science:951
|
ESI学科分类 | MATERIALS SCIENCE
|
Scopus记录号 | 2-s2.0-85142176334
|
来源库 | Scopus
|
引用统计 |
被引频次[WOS]:2
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/412533 |
专题 | 工学院_深港微电子学院 |
作者单位 | 1.School of Microelectronics,Southern University of Science and Technology,Shenzhen,518055,China 2.Engineering Research Center of Integrated Circuits for Next-Generation Communications,Ministry of Education,Southern University of Science and Technology,Shenzhen,518055,China 3.School of Microelectronics,Fudan University,Shanghai,200433,China |
第一作者单位 | 深港微电子学院 |
通讯作者单位 | 深港微电子学院; 南方科技大学 |
第一作者的第一单位 | 深港微电子学院 |
推荐引用方式 GB/T 7714 |
Lu,Honghao,Wen,Kangyao,Du,Fangzhou,et al. Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering[J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,2023,154.
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APA |
Lu,Honghao.,Wen,Kangyao.,Du,Fangzhou.,Tang,Chuying.,Cheng,Wei Chih.,...&Yu,Hongyu.(2023).Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,154.
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MLA |
Lu,Honghao,et al."Quasi-normally off AlGaN/GaN high-electron-mobility transistors with p-type CuOx gate synthesized through magnetron reactive sputtering".MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 154(2023).
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条目包含的文件 | 条目无相关文件。 |
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