题名 | Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography |
作者 | |
发表日期 | 2019-11-01
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DOI | |
发表期刊 | |
ISSN | 2166-2746
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EISSN | 2166-2754
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卷号 | 37期号:6 |
摘要 | Patterning high-aspect-ratio gratings by the phase-locked two-beam fiber-optic interference lithography (2-FOIL) is numerically and experimentally investigated in this paper. The Dill model is applied in the numerical simulation to understand the effects of an exposure dose and pattern contrast on the exposed photoresist grating profiles. Exposure experiments on the authors' home-built 2-FOIL setup are conducted to demonstrate the suitability for manipulating the linewidth of photoresist gratings by tuning the exposure dose to achieve high aspect ratios over 6 at high pattern contrast thanks to the phase-locking mechanism. The high-aspect-ratio photoresist gratings serve as an excellent etching mask for the subsequent pattern transfer into underlying silicon substrates for high-aspect-ratio silicon gratings. Using these high-aspect-ratio silicon gratings as the nanoimprint mold, a square nanomesh is demonstrated by means of the multiple-step nanoimprint lithography. The authors' work demonstrates that the proposed phase-locked 2-FOIL system enables high pattern contrast under long exposure duration, making it a suitable tool for fabricating high-aspect-ratio grating structures. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
|
资助项目 | Hong Kong Arts Development Council[17207419]
; Innovation and Technology Commission - Hong Kong[ITS/297/17]
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WOS研究方向 | Engineering
; Science & Technology - Other Topics
; Physics
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WOS类目 | Engineering, Electrical & Electronic
; Nanoscience & Nanotechnology
; Physics, Applied
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WOS记录号 | WOS:000522021700001
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出版者 | |
EI入藏号 | 20194207546947
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EI主题词 | Etching
; Fiber optics
; Locks (fasteners)
; Nanoimprint lithography
; Photoresists
|
EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
; Fiber Optics:741.1.2
; Nanotechnology:761
; Chemical Reactions:802.2
; Solid State Physics:933
|
ESI学科分类 | MATERIALS SCIENCE
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Scopus记录号 | 2-s2.0-85073265547
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:12
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/42482 |
专题 | 工学院_深港微电子学院 工学院_材料科学与工程系 |
作者单位 | 1.Department of Mechanical EngineeringUniversity of Hong Kong,Hong Kong,Hong Kong 2.School of MicroelectronicsSouthern University of Science and Technology,Shenzhen,China 3.Department of Materials Science and EngineeringSouthern University of Science and Technology,Shenzhen,China |
第一作者单位 | 深港微电子学院 |
推荐引用方式 GB/T 7714 |
Gan,Zhuofei,Cai,Jingxuan,Liang,Chuwei,et al. Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography[J]. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics,2019,37(6).
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APA |
Gan,Zhuofei.,Cai,Jingxuan.,Liang,Chuwei.,Chen,Liyang.,Min,Siyi.,...&Li,Wen Di.(2019).Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography.Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics,37(6).
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MLA |
Gan,Zhuofei,et al."Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography".Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics 37.6(2019).
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Gan-2019-Patterning (1739KB) | -- | -- | 限制开放 | -- |
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