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题名

Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography

作者
发表日期
2019-11-01
DOI
发表期刊
ISSN
2166-2746
EISSN
2166-2754
卷号37期号:6
摘要
Patterning high-aspect-ratio gratings by the phase-locked two-beam fiber-optic interference lithography (2-FOIL) is numerically and experimentally investigated in this paper. The Dill model is applied in the numerical simulation to understand the effects of an exposure dose and pattern contrast on the exposed photoresist grating profiles. Exposure experiments on the authors' home-built 2-FOIL setup are conducted to demonstrate the suitability for manipulating the linewidth of photoresist gratings by tuning the exposure dose to achieve high aspect ratios over 6 at high pattern contrast thanks to the phase-locking mechanism. The high-aspect-ratio photoresist gratings serve as an excellent etching mask for the subsequent pattern transfer into underlying silicon substrates for high-aspect-ratio silicon gratings. Using these high-aspect-ratio silicon gratings as the nanoimprint mold, a square nanomesh is demonstrated by means of the multiple-step nanoimprint lithography. The authors' work demonstrates that the proposed phase-locked 2-FOIL system enables high pattern contrast under long exposure duration, making it a suitable tool for fabricating high-aspect-ratio grating structures.
相关链接[Scopus记录]
收录类别
EI ; SCI
语种
英语
学校署名
其他
资助项目
Hong Kong Arts Development Council[17207419] ; Innovation and Technology Commission - Hong Kong[ITS/297/17]
WOS研究方向
Engineering ; Science & Technology - Other Topics ; Physics
WOS类目
Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS记录号
WOS:000522021700001
出版者
EI入藏号
20194207546947
EI主题词
Etching ; Fiber optics ; Locks (fasteners) ; Nanoimprint lithography ; Photoresists
EI分类号
Semiconductor Devices and Integrated Circuits:714.2 ; Fiber Optics:741.1.2 ; Nanotechnology:761 ; Chemical Reactions:802.2 ; Solid State Physics:933
ESI学科分类
MATERIALS SCIENCE
Scopus记录号
2-s2.0-85073265547
来源库
Scopus
引用统计
被引频次[WOS]:12
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/42482
专题工学院_深港微电子学院
工学院_材料科学与工程系
作者单位
1.Department of Mechanical EngineeringUniversity of Hong Kong,Hong Kong,Hong Kong
2.School of MicroelectronicsSouthern University of Science and Technology,Shenzhen,China
3.Department of Materials Science and EngineeringSouthern University of Science and Technology,Shenzhen,China
第一作者单位深港微电子学院
推荐引用方式
GB/T 7714
Gan,Zhuofei,Cai,Jingxuan,Liang,Chuwei,et al. Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography[J]. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics,2019,37(6).
APA
Gan,Zhuofei.,Cai,Jingxuan.,Liang,Chuwei.,Chen,Liyang.,Min,Siyi.,...&Li,Wen Di.(2019).Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography.Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics,37(6).
MLA
Gan,Zhuofei,et al."Patterning of high-aspect-ratio nanogratings using phase-locked two-beam fiber-optic interference lithography".Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics 37.6(2019).
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