题名 | Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering |
作者 | |
通讯作者 | He,Zhubing |
发表日期 | 2019-09-23
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DOI | |
发表期刊 | |
ISSN | 25740962
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EISSN | 2574-0962
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卷号 | 2期号:9页码:6883-6890 |
摘要 | The photoelectrochemical performance of Si photoanode with a metal-insulator-semiconductor (MIS) structure is limited by weak Schottky barrier and poor charge transfer. In this work, a MIS structure, n-Si|dispersed NiSi/NiO patches|Au nanoparticles, is designed for efficient water oxidization with high stability. The photoanode exhibits a high activity with a low onset potential of ∼0.88 V and a high photocurrent density of ∼34 mA/cm at 1.23 V versus reversible hydrogen electrode (RHE), and retains excellent stability in 1.0 M NaOH for ∼10 h. We find that the improved photovoltage is contributed by the strengthened pinch-off effect of inhomogeneous Schottky barriers induced by the synergistic effect of decreased Schottky barrier height difference and increased depletion width in n-Si. We show that the enhanced photocurrent attributes to the reduced hole transport resistance by introducing high-conductive NiSi and Au-NP bridge layers. Our findings demonstrate a promising strategy for the development of highly efficient and stable Si-based photoelectrodes for water oxidization. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
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资助项目 | Universidade de Macau[]
; National Natural Science Foundation of China[61775091]
; School for Advanced Research[FDCT-110/2014/SB]
; Science and Technology Development Fund[]
; [JCYJ20180504165851864]
; National Natural Science Foundation of China[]
; Shenzhen Key Laboratory of Neuropsychiatric Modulation[ZDSYS201602261933302]
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WOS研究方向 | Chemistry
; Energy & Fuels
; Materials Science
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WOS类目 | Chemistry, Physical
; Energy & Fuels
; Materials Science, Multidisciplinary
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WOS记录号 | WOS:000487770000086
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出版者 | |
EI入藏号 | 20193907479434
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EI主题词 | Charge transfer
; Electrochemistry
; Gold nanoparticles
; Metal insulator boundaries
; MIS devices
; Nanoparticles
; Schottky barrier diodes
; Silicon compounds
; Sodium hydroxide
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EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
; Nanotechnology:761
; Electrochemistry:801.4.1
; Chemical Reactions:802.2
; Solid State Physics:933
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Scopus记录号 | 2-s2.0-85072645358
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:7
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/43874 |
专题 | 工学院_材料科学与工程系 |
作者单位 | 1.Joint Key Laboratory of the Ministry of EducationInstitute of Applied Physics and Materials EngineeringUniversity of Macau,999078,Macao 2.Department of Physics and ChemistryFaculty of Science and TechnologyUniversity of Macau,999078,Macao 3.Department of Materials Science and EngineeringShenzhen Key Laboratory of Full Spectral Solar Electricity Generation (FSSEG)Southern University of Science and Technology,Shenzhen, Guangdong,No. 1088, Xueyuan Road,518055,China 4.Ningbo Institute of Material Technology and EngineeringChinese Academy of Sciences,Ningbo, Zhejiang,315201,China |
第一作者单位 | 材料科学与工程系 |
通讯作者单位 | 材料科学与工程系 |
推荐引用方式 GB/T 7714 |
Ying,Zhiqin,Yang,Xi,Tong,Rui,et al. Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering[J]. ACS Applied Energy Materials,2019,2(9):6883-6890.
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APA |
Ying,Zhiqin.,Yang,Xi.,Tong,Rui.,Zhu,Qing.,Chen,Tian.,...&Pan,Hui.(2019).Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering.ACS Applied Energy Materials,2(9),6883-6890.
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MLA |
Ying,Zhiqin,et al."Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering".ACS Applied Energy Materials 2.9(2019):6883-6890.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
Ying-2019-Enhancing (1928KB) | -- | -- | 限制开放 | -- |
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