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题名

Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering

作者
通讯作者He,Zhubing
发表日期
2019-09-23
DOI
发表期刊
ISSN
25740962
EISSN
2574-0962
卷号2期号:9页码:6883-6890
摘要
The photoelectrochemical performance of Si photoanode with a metal-insulator-semiconductor (MIS) structure is limited by weak Schottky barrier and poor charge transfer. In this work, a MIS structure, n-Si|dispersed NiSi/NiO patches|Au nanoparticles, is designed for efficient water oxidization with high stability. The photoanode exhibits a high activity with a low onset potential of ∼0.88 V and a high photocurrent density of ∼34 mA/cm at 1.23 V versus reversible hydrogen electrode (RHE), and retains excellent stability in 1.0 M NaOH for ∼10 h. We find that the improved photovoltage is contributed by the strengthened pinch-off effect of inhomogeneous Schottky barriers induced by the synergistic effect of decreased Schottky barrier height difference and increased depletion width in n-Si. We show that the enhanced photocurrent attributes to the reduced hole transport resistance by introducing high-conductive NiSi and Au-NP bridge layers. Our findings demonstrate a promising strategy for the development of highly efficient and stable Si-based photoelectrodes for water oxidization.
关键词
相关链接[Scopus记录]
收录类别
EI ; SCI
语种
英语
学校署名
通讯
资助项目
Universidade de Macau[] ; National Natural Science Foundation of China[61775091] ; School for Advanced Research[FDCT-110/2014/SB] ; Science and Technology Development Fund[] ; [JCYJ20180504165851864] ; National Natural Science Foundation of China[] ; Shenzhen Key Laboratory of Neuropsychiatric Modulation[ZDSYS201602261933302]
WOS研究方向
Chemistry ; Energy & Fuels ; Materials Science
WOS类目
Chemistry, Physical ; Energy & Fuels ; Materials Science, Multidisciplinary
WOS记录号
WOS:000487770000086
出版者
EI入藏号
20193907479434
EI主题词
Charge transfer ; Electrochemistry ; Gold nanoparticles ; Metal insulator boundaries ; MIS devices ; Nanoparticles ; Schottky barrier diodes ; Silicon compounds ; Sodium hydroxide
EI分类号
Semiconductor Devices and Integrated Circuits:714.2 ; Nanotechnology:761 ; Electrochemistry:801.4.1 ; Chemical Reactions:802.2 ; Solid State Physics:933
Scopus记录号
2-s2.0-85072645358
来源库
Scopus
引用统计
被引频次[WOS]:7
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/43874
专题工学院_材料科学与工程系
作者单位
1.Joint Key Laboratory of the Ministry of EducationInstitute of Applied Physics and Materials EngineeringUniversity of Macau,999078,Macao
2.Department of Physics and ChemistryFaculty of Science and TechnologyUniversity of Macau,999078,Macao
3.Department of Materials Science and EngineeringShenzhen Key Laboratory of Full Spectral Solar Electricity Generation (FSSEG)Southern University of Science and Technology,Shenzhen, Guangdong,No. 1088, Xueyuan Road,518055,China
4.Ningbo Institute of Material Technology and EngineeringChinese Academy of Sciences,Ningbo, Zhejiang,315201,China
第一作者单位材料科学与工程系
通讯作者单位材料科学与工程系
推荐引用方式
GB/T 7714
Ying,Zhiqin,Yang,Xi,Tong,Rui,et al. Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering[J]. ACS Applied Energy Materials,2019,2(9):6883-6890.
APA
Ying,Zhiqin.,Yang,Xi.,Tong,Rui.,Zhu,Qing.,Chen,Tian.,...&Pan,Hui.(2019).Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering.ACS Applied Energy Materials,2(9),6883-6890.
MLA
Ying,Zhiqin,et al."Enhancing the Efficiency and Stability of NiOx-Based Silicon Photoanode via Interfacial Engineering".ACS Applied Energy Materials 2.9(2019):6883-6890.
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