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题名

A new wet etching method for black phosphorus layer number engineering: Experiment, modeling and DFT simulations

作者
DOI
发表日期
2019-09-01
会议录名称
卷号
2019-September
会议地点
Udine, Italy
出版者
摘要

This paper reports the successful atomic layer patterning of 2-dimensional Black Phosphorus (BP) and the simulation of the etching process by Density Functional Theory (DFT) method. The wet etching process can etch selected regions of few-layer black phosphorous with an atomic layer accuracy, which provides a feasible patterning approach for large-scale manufacturing of few-layer BP materials and devices. Absorption energies of iodine atoms/molecules at different location of BP layer edge were also calculated by DFT method, shown a vertical etching direction preference which was important for achieving high quality patterns.

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其他
语种
英语
相关链接[Scopus记录]
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EI入藏号
20194507624112
EI主题词
Atoms ; Density functional theory ; Phosphorus ; Semiconductor devices
EI分类号
Semiconductor Devices and Integrated Circuits:714.2 ; Chemical Products Generally:804 ; Atomic and Molecular Physics:931.3
Scopus记录号
2-s2.0-85074334177
来源库
Scopus
引用统计
被引频次[WOS]:0
成果类型会议论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/43880
专题工学院_深港微电子学院
工学院_材料科学与工程系
作者单位
1.Department of Materials EngineeringUniversity of British Columbia,Vancouver,Canada
2.Department of Materials EngineeringDepartment of Physics and AstronomyStewart Blusson Quantum Matter Institute University of British Columbia,Vancouver,Canada
3.Department of PhysicsSimon Fraser University,Vancouver,Canada
4.School of MicroelectronicsSouthern University of Science of Technology,Shenzhen,China
推荐引用方式
GB/T 7714
Liu,Teren,Fang,Tao,Kavanagh,Karen,et al. A new wet etching method for black phosphorus layer number engineering: Experiment, modeling and DFT simulations[C]:Institute of Electrical and Electronics Engineers Inc.,2019.
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