题名 | A new wet etching method for black phosphorus layer number engineering: Experiment, modeling and DFT simulations |
作者 | |
DOI | |
发表日期 | 2019-09-01
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会议录名称 | |
卷号 | 2019-September
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会议地点 | Udine, Italy
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出版者 | |
摘要 | This paper reports the successful atomic layer patterning of 2-dimensional Black Phosphorus (BP) and the simulation of the etching process by Density Functional Theory (DFT) method. The wet etching process can etch selected regions of few-layer black phosphorous with an atomic layer accuracy, which provides a feasible patterning approach for large-scale manufacturing of few-layer BP materials and devices. Absorption energies of iodine atoms/molecules at different location of BP layer edge were also calculated by DFT method, shown a vertical etching direction preference which was important for achieving high quality patterns. |
关键词 | |
学校署名 | 其他
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语种 | 英语
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相关链接 | [Scopus记录] |
收录类别 | |
EI入藏号 | 20194507624112
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EI主题词 | Atoms
; Density functional theory
; Phosphorus
; Semiconductor devices
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EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
; Chemical Products Generally:804
; Atomic and Molecular Physics:931.3
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Scopus记录号 | 2-s2.0-85074334177
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:0
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/43880 |
专题 | 工学院_深港微电子学院 工学院_材料科学与工程系 |
作者单位 | 1.Department of Materials EngineeringUniversity of British Columbia,Vancouver,Canada 2.Department of Materials EngineeringDepartment of Physics and AstronomyStewart Blusson Quantum Matter Institute University of British Columbia,Vancouver,Canada 3.Department of PhysicsSimon Fraser University,Vancouver,Canada 4.School of MicroelectronicsSouthern University of Science of Technology,Shenzhen,China |
推荐引用方式 GB/T 7714 |
Liu,Teren,Fang,Tao,Kavanagh,Karen,et al. A new wet etching method for black phosphorus layer number engineering: Experiment, modeling and DFT simulations[C]:Institute of Electrical and Electronics Engineers Inc.,2019.
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条目包含的文件 | 条目无相关文件。 |
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