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题名

Size-dependent yield function for single crystals with a consideration of defect effects

作者
通讯作者Pan,Bo
发表日期
2019
DOI
发表期刊
ISSN
0001-5970
EISSN
1619-6937
卷号230期号:12页码:4259-4271
摘要
In this work, a size-dependent yield function for a single crystal is developed by considering defect effects, including dislocation pile-up, dislocation starvation, and source exhaustion, especially for micro-pillars. It is found that the proposed yield function compares well with the experimental data, and the proposed model is the extension of a single-arm source model to describe the yielding behavior under a more complicated loading case, not only the uniaxial compression test. Our quantitative conclusions suggest that the stacking-fault energy (SFE), the crystallographic orientation, and the slip system are significant factors for the shape of the yield surface: the slip system determines the number of the edges of the yield surface; the crystallographic orientation controls the angles between the adjacent edges but does not change the number of the edges; the low SFE can make sharp corners rounded and contract the shape of the yield surface, or even curve the edge of the yield surface. Moreover, we investigate the explicit relationship among the stacking-fault energy, the dislocation pile-up effect inside the sample, and the shape of the yield surface: materials with a low stacking-fault energy exhibit pronounced dislocation pile-up effects, and their yield surfaces tend to display rounded vertices, corresponding to the v. Mises yield criterion for the single-crystal sample with a {1 1 1} slip system for example; those with a high stacking-fault energy show typical Tresca criterion-type yield surfaces displaying sharp vertices for the single-crystal sample with a {1 1 1} slip system for example. We also show that this yield function can describe the size-dependent yield surface by considering the stochastic length of the dislocation source and the dislocation pile-up length in single-crystalline micro-pillars.
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
[2015JM5233]
WOS研究方向
Mechanics
WOS类目
Mechanics
WOS记录号
WOS:000495241900008
出版者
EI入藏号
20193707438192
EI主题词
Compression testing ; Piles ; Single crystals ; Stacking faults ; Stochastic systems
EI分类号
Structural Members and Shapes:408.2 ; Crystalline Solids:933.1 ; Crystal Lattice:933.1.1 ; Systems Science:961
ESI学科分类
ENGINEERING
Scopus记录号
2-s2.0-85072115609
来源库
Scopus
引用统计
被引频次[WOS]:3
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/44069
专题南方科技大学
工学院_材料科学与工程系
作者单位
1.Xi’an Thermal Power Research Institute Co. Ltd.,Xi’an,710054,China
2.Department of Mechanical EngineeringOsaka University,Suita,565-0871,Japan
3.Southern University of Science and Technology,Shenzhen,518055,China
4.School of Materials Science and EngineeringXi’an University of Technology,Xi’an,710048,China
5.Joining and Wedding Research InstituteOsaka University,Ibaraki,567-0047,Japan
推荐引用方式
GB/T 7714
Pan,Bo,Tanaka,Hiro,Ling,Chao,et al. Size-dependent yield function for single crystals with a consideration of defect effects[J]. ACTA MECHANICA,2019,230(12):4259-4271.
APA
Pan,Bo,Tanaka,Hiro,Ling,Chao,Shibutani,Yoji,&Li,Shufeng.(2019).Size-dependent yield function for single crystals with a consideration of defect effects.ACTA MECHANICA,230(12),4259-4271.
MLA
Pan,Bo,et al."Size-dependent yield function for single crystals with a consideration of defect effects".ACTA MECHANICA 230.12(2019):4259-4271.
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