题名 | A 0.5V 46.2ppm°C CMOS Voltage Reference Based on Compensated Δv TH with Wide Temperature Range and High PSRR |
作者 | |
DOI | |
发表日期 | 2018-12-21
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ISBN | 978-1-5386-4860-5
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会议录名称 | |
页码 | 66-69
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会议日期 | 24-27 June 2018
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会议地点 | Montreal, QC, Canada
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出版者 | |
摘要 | This paper presents a CMOS voltage reference (CVR) with low power, high power supply ripple rejection (PSRR), and small area operating in a wide temperature range. The proposed circuit contains only MOSFETs biased in subthreshold region and operates based on compensated Δ V of two different-type transistors. Implemented in a standard 0.18Μm CMOS process, the measured reference voltage of the proposed CVR is 344 mV with standard deviation of only 2.89 mV and achieves an average TC of 46.2ppm°C over a wide temperature range from - 40 °C to 125°C without individual chip-by-chip trimming. The measured PSRR is -70 dB, -51 dB and -52 dB at 10 Hz, 100 kHz and 10 MHz, respectively. The measured line sensitivity (LS) is 0.25%/V while consuming 15.65nW at 0.5V supply. The active area is 0.019mm |
关键词 | |
学校署名 | 第一
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语种 | 英语
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相关链接 | [Scopus记录] |
收录类别 | |
资助项目 | National Natural Science Foundation of China[61604067]
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EI入藏号 | 20190606463040
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EI主题词 | Voltage measurement
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EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
; Electric Variables Measurements:942.2
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Scopus记录号 | 2-s2.0-85060885727
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来源库 | Scopus
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全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8585544 |
引用统计 |
被引频次[WOS]:0
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/44152 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Department of Electrical and Electronic EngineeringSouthern University of Science and Technology,Shenzhen,China 2.College of Electronic Information and Optical EngineeringNankai University,Tianjin,China |
第一作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
He,Linjun,Zhan,Chenchang,Nan,Yang,et al. A 0.5V 46.2ppm°C CMOS Voltage Reference Based on Compensated Δv TH with Wide Temperature Range and High PSRR[C]:Institute of Electrical and Electronics Engineers Inc.,2018:66-69.
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