A universal approach of modelling the dielectric behaviors of percolative composite ceramics and thin films

Tang，Yu1,2; Xiao，Bin2,3; Qiao，Yating1; Zhang，Yi2,4; Li，Shun1; Du，Piyi2

2019-10-23

10.1088/2053-1591/ab4d69

Materials Research Express   影响因子和分区

20531591

2053-1591

The topological microstructures and electrical conductivities of (1-x)BaTiO/xNiZnFeO (BTO/NZFO) composite ceramics and thin films both exhibit a classic percolative behavior at the percolation threshold and can be well interpreted under the framework of percolation theory. However, their permittivities are in accordance with the Kirkpatrick model, which is contradictory with the well-established percolation model as revealed in previous studies. To elucidate this interesting phenomenon both experimentally and theoretically, a universal approach of modelling the dielectric behaviors of percolative systems was proposed by using equivalent circuit concept. Based on our approach, it can be revealed that the impedance of the conductive phase is too small to play a predominant role in the dielectric performance of the composites, rendering the measured capacitance and apparent permittivity to be giant around the percolation threshold. Only when the conductivity of the conductive phase reaches a certain value does this behavior appear, which can be satisfactorily interpreted in light of our universal model.

composite ceramic composite thin film dielectric equivalent circuit percolation universal model

EI ; SCI

英语

其他

ShenzhenDRCproject[[2018]1433]

Materials Science

Materials Science, Multidisciplinary

WOS:000504253000003

Institute of Physics Publishing

20194707721347

Barium titanate ; Ceramic materials ; Circuit theory ; Composite films ; Dielectric materials ; Equivalent circuits ; Percolation (computer storage) ; Percolation (fluids) ; Percolation (solid state) ; Permittivity ; Solvents ; Thin films

Electric Networks:703.1 ; Dielectric Materials:708.1 ; Semiconductor Devices and Integrated Circuits:714.2 ; Data Storage, Equipment and Techniques:722.1 ; Chemical Agents and Basic Industrial Chemicals:803 ; Ceramics:812.1

2-s2.0-85075231119

Scopus

1.Department of Materials Science and Engineering,College of Aerospace Science and Engineering,National University of Defense Technology,Changsha,410073,China
2.State Key Laboratory of Silicon Materials,School of Materials Science and Engineering,Zhejiang University,Hangzhou,310027,China
3.Department of Materials Science and Engineering,Shenzhen Engineering Research Center for Novel Electronic Information Materials and Devices,Southern University of Science and Technology,Shenzhen,518055,China
4.Department of Physics,College of Liberal Arts and Sciences,National University of Defense Technology,Changsha,410073,China

Tang，Yu,Xiao，Bin,Qiao，Yating,et al. A universal approach of modelling the dielectric behaviors of percolative composite ceramics and thin films[J]. Materials Research Express,2019,6(11).

Tang，Yu,Xiao，Bin,Qiao，Yating,Zhang，Yi,Li，Shun,&Du，Piyi.(2019).A universal approach of modelling the dielectric behaviors of percolative composite ceramics and thin films.Materials Research Express,6(11).

Tang，Yu,et al."A universal approach of modelling the dielectric behaviors of percolative composite ceramics and thin films".Materials Research Express 6.11(2019).