Adaptive Dynamic Analysis-based Optical Coherence Tomography Angiography for Blood Vessel Tail Artifacts Suppression

Junxiong Zhou; Yuntao Li; Jianbo Tang

10.1109/OGC55558.2022.10050995

2022

IEEE 7th Optoelectronics Global Conference (OGC)

978-1-6654-8699-6

2022 IEEE 7th Optoelectronics Global Conference (OGC)

205-209

6-11 Dec. 2022

Shenzhen, China

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

Optical coherence tomography angiography (OCTA) for blood vessel 3-D structure imaging suffers from blood vessel tail artifacts when using a long decorrelation time (e.g., repeat B-scan acquisition in regular OCTA) or loss of micro vessel signal when using a short decorrelation time. In this work, we developed an adaptive first order field autocorrelation function (g1) analysis-based technique to suppress the tail artifacts under macro vessels while enhancing the dynamic signal of micro vessels.The proposed method is based on the differences of the decorrelation rate and the phase variations of g1 between the vessel voxels and the artifacts regions. A short or a long decorrelation time was applied to obtain the dynamic index of the tail artifacts region or the blood vessel region, respectively. Compared to the post image processing-based techniques, the proposed approach addresses this problem through the physical basis and shows a good performance in suppressing the tail artifacts while enhancing the detection of the micro vessels.

optical coherence tomography angiography brain imaging dynamic imaging

第一

英语

CPCI-S

Shenzhen Science and technology Innovation Committee[20210316161406001] ; Guangdong Science and Technology Department[2022A1515011984]

Engineering ; Optics

Engineering, Electrical & Electronic ; Optics

WOS:000987126800046

IEEE

Department of Biomedical Engineering, Southern University of Science and Technology, Shenzhen, China

Junxiong Zhou,Yuntao Li,Jianbo Tang. Adaptive Dynamic Analysis-based Optical Coherence Tomography Angiography for Blood Vessel Tail Artifacts Suppression[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2022:205-209.