题名 | A systematic evaluation of problematic tests generated by evosuite |
作者 | |
通讯作者 | Fan, Zhiyu |
DOI | |
发表日期 | 2019
|
ISSN | 2574-1926
|
ISBN | 978-1-7281-1765-2
|
会议录名称 | |
页码 | 165-167
|
会议日期 | 25-31 May 2019
|
会议地点 | Montreal, QC, Canada
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
|
出版者 | |
摘要 | With the rapidly growing scale of modern software, the reliability of software systems has become essential. To ease the developers' pressure of writing unit tests manually, test generation tools such as EvoSuite and Randoop were proposed. Although these approaches have been shown to be able to automatically generate tests for achieving high coverage, the generated tests may be ineffective in detecting real faults. Particularly, these automatically generated tests may suffer from several problems (we call them problematic tests): (1) incorrect oracle. (2) unexpected exception/error. (3) flaky test. We present a comprehensive study of EvoSuite in Defects4j, and performed a detailed analysis of the reasons behind these automatically generated problematic tests. Our analysis identifies 528 problematic tests: 208 (39.4%) of them are caused by incorrect oracle, 319 (60.4%) are caused by unexpected exception/error, and one flaky test. © 2019 IEEE. |
关键词 | |
学校署名 | 第一
; 通讯
|
语种 | 英语
|
相关链接 | [来源记录] |
收录类别 | |
WOS研究方向 | Computer Science
|
WOS类目 | Computer Science, Software Engineering
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WOS记录号 | WOS:000503272600049
|
EI入藏号 | 20193707414539
|
EI主题词 | Software reliability
|
EI分类号 | Computer Applications:723.5
; Automatic Control Principles and Applications:731
|
来源库 | EV Compendex
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8802709 |
引用统计 |
被引频次[WOS]:3
|
成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/50901 |
专题 | 南方科技大学 |
作者单位 | Southern University of Science and Technology, China |
第一作者单位 | 南方科技大学 |
通讯作者单位 | 南方科技大学 |
第一作者的第一单位 | 南方科技大学 |
推荐引用方式 GB/T 7714 |
Fan, Zhiyu. A systematic evaluation of problematic tests generated by evosuite[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:Institute of Electrical and Electronics Engineers Inc.,2019:165-167.
|
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