Investigation of the electronic structure of BiFeO3 epitaxial films by polarized X-ray absorption spectroscopy

Wang, H.B.1; Luo, Z.L.1; Dong, Y.Q.1; Zhao, Z.L.1; Yang, Y.J.1; Chen, Z.H.2; Yang, M.M.1; Hu, S.X.1; Chen, L.3; Gao, C.1

10.4028/www.scientific.net/MSF.815.183

2015

0255-5476

MATER SCI FORUM

815

183-187

Chengdu, China

Trans Tech Publications Ltd

To investigate the epitaxial strain effect on local electronic structure of FeO6 octahedron of BiFeO3 epitaxial film, polarization-dependent Fe L23-edge x-ray absorption spectroscopy studies were performed on both tetragonal(T)-like BFO/LAO and rhombohedral(R)-like BFO/STO epitaxial films. Charge transfer multiplet theory based fittings were also performed to reveal the local electronic structure difference. Due to dramatic structural difference caused by epitaxial strain between these two samples, significant electronic structure differences were observed between these two specimens. For BFO/LAO, anisotropic electronic structure appears in vertically-elongated FeO6 octahedron and an additional shift of Fe ion off the central position is suggested. For BFO/STO, electronic structure is almost isotropic.
© (2015) Trans Tech Publications, Switzerland.

其他

EI

20151800812079

Bismuth compounds ; Charge transfer ; Electronic structure ; Epitaxial films ; Functional materials ; Iron ; X ray absorption spectroscopy

Iron:545.1 ; Chemical Reactions:802.2 ; Chemical Operations:802.3 ; Atomic and Molecular Physics:931.3 ; Materials Science:951

EV Compendex

1.National Synchrotron Radiation Laboratory and Collaborative Innovation Center of Chemistry for Energy Materials, University of Science and Technology of China, Hefei; 230026, China
2.Department of Materials Science and Engineering, University of California, Berkeley; 94720, United States
3.Department of Physics, South University of Science and Technology of China, Shenzhen; 518055, China

Wang, H.B.,Luo, Z.L.,Dong, Y.Q.,et al. Investigation of the electronic structure of BiFeO3 epitaxial films by polarized X-ray absorption spectroscopy[C]:Trans Tech Publications Ltd,2015:183-187.