A 4-Vppd160-Gb/s PAM-4 Optical Modulator Driver with All-Pass Filter-Based Dynamic Bias and 2- Tap FFE in 130-nm BiCMOS

Shuo Feng1; Fuzhan Chen1; Zhenghao Li1; Wentao Zhou1; Dongfan Xu1; Chun-Zhang Chen2; Xuhui Liu2; Hanming Wu2; Quan Pan1

10.1109/APCCAS55924.2022.10090363

2022

IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

978-1-6654-5080-5

2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

1-5

11-13 Nov. 2022

Shenzhen, China

345 E 47TH ST, NEW YORK, NY 10017 USA

IEEE

This paper presents a high-speed, large-output swing driver with 2-tap feed-forward equalizer (FFE) for optical modulators in 130-nm SiGe BiCMOS process. A breakdown voltage (BV) doubler topology with all-pass filter (APF)-based dynamic bias is applied in the driver to improve the output swing and the bandwidth. A 2-tap fractional-spaced FFE is implemented to compensate for the insufficient bandwidth of optical modulators. Simulation results indicate that the driver achieves an output swing of 4 V-ppd and a 3-dB bandwidth of 62.4 GHz with a power consumption of 1.15 W. The performance of the driver is further evaluated in an electrical/optical (E/O) system where a Verilog-A model for Mach-Zehnder Modulator (MZM) with a 3-dB bandwidth of 35 GHz is used. Taking advantages of the 2-tap FFE, the E/O system achieves a 3-dB bandwidth of 50.4 GHz and can support 160-Gb/s PAM-4 optical communications.

all-pass filter breakdown voltage doubler electrical-optical system feed-forward equalizer optical modulator driver

第一

英语

CPCI-S

NSFC["JCYJ20190809142017428","JCYJ20200109141225025"]

Computer Science ; Engineering

Computer Science, Hardware & Architecture ; Engineering, Electrical & Electronic

WOS:000987045300071

IEEE

1.School of Microelectronics, Southern University of Science and Technology, Shenzhen, China
2.Peng Cheng Laboratory, Shenzhen, China

Shuo Feng,Fuzhan Chen,Zhenghao Li,et al. A 4-Vppd160-Gb/s PAM-4 Optical Modulator Driver with All-Pass Filter-Based Dynamic Bias and 2- Tap FFE in 130-nm BiCMOS[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2022:1-5.