题名 | Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs |
作者 | |
通讯作者 | Persson, Per O. A. |
发表日期 | 2023-07-10
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DOI | |
发表期刊 | |
ISSN | 0003-6951
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EISSN | 1077-3118
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卷号 | 123期号:2 |
摘要 | Structural defects are detrimental to the efficiency and quality of optoelectronic semiconductor devices. In this work, we study InGaN platelets with a quantum well structure intended for nano-LEDs emitting red light and how their optical properties, measured with cathodoluminescence, relate to the corresponding atomic structure. Through a method of spectroscopy-thinning-imaging, we demonstrate in plan-view how stacking mismatch boundaries intersect the quantum well in a pattern correlated with the observed diminished cathodoluminescence intensity. The results highlight the importance of avoiding stacking mismatch in small LED structures due to the relatively large region of non-radiative recombination caused by the mismatch boundaries. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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重要成果 | NI论文
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学校署名 | 其他
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资助项目 | Swedish Governmental Agency for Innovation Systems (VINNOVA): Competence Center Program[2016-05190]
; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoeping University, Faculty[2009-00971]
; Swedish Research Council[EM16-0024]
; Swedish National Infrastructure in Advanced Electron Microscopy["2022-02832","2021-00171"]
; Swedish Foundation for Strategic Research[RIF21-0026]
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WOS研究方向 | Physics
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WOS类目 | Physics, Applied
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WOS记录号 | WOS:001028129700008
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出版者 | |
EI入藏号 | 20233014433211
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EI主题词 | Gallium alloys
; High resolution transmission electron microscopy
; III-V semiconductors
; Indium alloys
; Light emitting diodes
; Optical properties
; Platelets
; Scanning electron microscopy
; Semiconductor alloys
; Semiconductor quantum wells
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EI分类号 | Biology:461.9
; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3
; Electricity: Basic Concepts and Phenomena:701.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Light/Optics:741.1
; Optical Devices and Systems:741.3
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ESI学科分类 | PHYSICS
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:4
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/553279 |
专题 | 南方科技大学 |
作者单位 | 1.Linkoping Univ, Dept Phys Chem & Biol IFM, Thin Film Phys Div, SE-58183 Linkoping, Sweden 2.Linkoping Univ, Competence Ctr 3 Nitride Technol C3NiT Janzen, Dept Phys Chem & Biol IFM, SE-58183 Linkoping, Sweden 3.Lund Univ, Solid State Phys & NanoLund, Box 118, SE-22100 Lund, Sweden 4.Future Display Inst Xiamen, Xiamen 361005, Peoples R China 5.Southern Univ Sci & Technol, Inst Nanosci & Applicat, Shenzhen, Peoples R China |
推荐引用方式 GB/T 7714 |
Persson, Axel R. R.,Gustafsson, Anders,Bi, Zhaoxia,et al. Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs[J]. APPLIED PHYSICS LETTERS,2023,123(2).
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APA |
Persson, Axel R. R.,Gustafsson, Anders,Bi, Zhaoxia,Samuelson, Lars,Darakchieva, Vanya,&Persson, Per O. A..(2023).Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs.APPLIED PHYSICS LETTERS,123(2).
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MLA |
Persson, Axel R. R.,et al."Correlating cathodoluminescence and scanning transmission electron microscopy for InGaN platelet nano-LEDs".APPLIED PHYSICS LETTERS 123.2(2023).
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条目包含的文件 | 条目无相关文件。 |
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