题名 | Electroluminescence and Gate Carrier Dynamics in a Schottky-type p-GaN Gate Double-Channel GaN HEMT |
作者 | |
发表日期 | 2023
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DOI | |
发表期刊 | |
ISSN | 1558-0563
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卷号 | PP期号:99页码:1-1 |
关键词 | |
相关链接 | [IEEE记录] |
收录类别 | |
学校署名 | 其他
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WOS记录号 | WOS:001080705500001
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EI入藏号 | 20233214504611
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EI主题词 | Aluminum nitride
; Buffer layers
; Dynamics
; Electroluminescence
; Gallium nitride
; High electron mobility transistors
; Logic gates
; Temperature distribution
; Temperature measurement
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EI分类号 | Thermodynamics:641.1
; Electricity: Basic Concepts and Phenomena:701.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Logic Elements:721.2
; Light, Optics and Optical Devices:741
; Organic Compounds:804.1
; Inorganic Compounds:804.2
; Crystalline Solids:933.1
; Temperature Measurements:944.6
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ESI学科分类 | ENGINEERING
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来源库 | IEEE
|
全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10208223 |
引用统计 |
被引频次[WOS]:5
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/553336 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.HKUST Shenzhen Research Institute, Shenzhen, China 2.Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Hong Kong, China 3.Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China |
推荐引用方式 GB/T 7714 |
Sirui Feng,Hang Liao,Tao Chen,et al. Electroluminescence and Gate Carrier Dynamics in a Schottky-type p-GaN Gate Double-Channel GaN HEMT[J]. IEEE Electron Device Letters,2023,PP(99):1-1.
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APA |
Sirui Feng.,Hang Liao.,Tao Chen.,Junting Chen.,Yan Cheng.,...&Kevin J. Chen.(2023).Electroluminescence and Gate Carrier Dynamics in a Schottky-type p-GaN Gate Double-Channel GaN HEMT.IEEE Electron Device Letters,PP(99),1-1.
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MLA |
Sirui Feng,et al."Electroluminescence and Gate Carrier Dynamics in a Schottky-type p-GaN Gate Double-Channel GaN HEMT".IEEE Electron Device Letters PP.99(2023):1-1.
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条目包含的文件 | 条目无相关文件。 |
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