题名 | Neuro-Modulated Hebbian Learning for Fully Test-Time Adaptation |
作者 | |
DOI | |
发表日期 | 2023
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ISSN | 1063-6919
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ISBN | 979-8-3503-0130-4
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会议录名称 | |
卷号 | 2023-June
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页码 | 3728-3738
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会议日期 | 17-24 June 2023
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会议地点 | Vancouver, BC, Canada
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摘要 | Fully test-time adaptation aims to adapt the network model based on sequential analysis of input samples during the inference stage to address the cross-domain performance degradation problem of deep neural networks. We take inspiration from the biological plausibility learning where the neuron responses are tuned based on a local synapse-change procedure and activated by competitive lateral inhibition rules. Based on these feed-forward learning rules, we design a soft Hebbian learning process which provides an unsupervised and effective mechanism for online adaptation. We observe that the performance of this feed-forward Hebbian learning for fully test-time adaptation can be significantly improved by incorporating a feedback neuromodulation layer. It is able to fine-tune the neuron responses based on the external feedback generated by the error backpropagation from the top inference layers. This leads to our proposed neuro-modulated Hebbian learning (NHL) method for fully test-time adaptation. With the unsupervised feed-forward soft Hebbian learning being combined with a learned neuromodulator to capture feedback from external responses, the source model can be effectively adapted during the testing process. Experimental results on benchmark datasets demonstrate that our proposed method can significantly improve the adaptation performance of network models and outperforms existing state-of-the-art methods. |
关键词 | |
学校署名 | 第一
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相关链接 | [IEEE记录] |
收录类别 | |
WOS记录号 | WOS:001058542604006
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EI入藏号 | 20234114868428
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来源库 | IEEE
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全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10203770 |
引用统计 |
被引频次[WOS]:7
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成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/559176 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Department of Electronic and Electrical Engineering, Southern University of Science and Technology, Shenzhen, China 2.Advanced Computing and Storage Laboratory, Huawei Technologies Co., Ltd., Shenzhen, China |
第一作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Yushun Tang,Ce Zhang,Heng Xu,et al. Neuro-Modulated Hebbian Learning for Fully Test-Time Adaptation[C],2023:3728-3738.
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条目包含的文件 | 条目无相关文件。 |
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