Passive Intermodulation on Microstrip Induced by Microstructured Edge

Cao, Zhi1; Cai, Yahui1; Zhao, Xiaolong1; Zhang, Songchang1; Zhang, Keyue1; Chen, Xiong2,3; He, Yongning1

2023-08-01

10.1109/TMTT.2023.3305151

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES   影响因子和分区

0018-9480

1557-9670

Considering the distributed electrothermal coupling effect, passive intermodulation (PIM) products in very long microstrip lines (MLs) have been deeply studied theoretically and experimentally; however, the complex PIM behaviors of short MLs (SMLs) arising from edge defects are still not well presented, and the nonlinearity mechanism has not been revealed until now. In this article, we propose the microscale single-and double-triangle structures to represent intended random defect patterns on the edge of SMLs. Then, we fabricate multiple 20-mm-long SML samples on sapphire crystal wafers employing the metal lift-off technology (MLOT). By PIM measurements and scanning electron microscope (SEM) image observations, we find statistically that the PIM levels of the SMLs with nanoscale depressions and holes on the top edge are over 10 dB higher than that of the SMLs with dense and smooth edges. Based on the statistical approach, we confirm that the discontinuous nanoscale defects on the top edge are the nonlinearity origin. And the microscale structure will enhance the localized electrical field concentration according to the electrical simulations. Considering the electrical field enhancement effect of microscale structure and the nanoscale defects as nonlinearity sources, an analytical PIM model for SMLs is established.

Discontinuous nanoscale defects edge defects microscale structures passive intermodulation (PIM) short microstrip lines (SMLs)

SCI ; EI

英语

其他

National Science Foundation of China[62271240] ; National Key Laboratory Foundation["2021-JCJQ-LB-006","6142411122115"]

Engineering

Engineering, Electrical & Electronic

WOS:001060717000001

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

ENGINEERING

Web of Science

1.Xi An Jiao Tong Univ, Sch Microelect, Xian 710072, Peoples R China
2.Chinese Univ Hong Kong, Dept Elect Engn, Hong Kong, Peoples R China
3.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China

Cao, Zhi,Cai, Yahui,Zhao, Xiaolong,et al. Passive Intermodulation on Microstrip Induced by Microstructured Edge[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,2023,PP(99):1-14.

Cao, Zhi.,Cai, Yahui.,Zhao, Xiaolong.,Zhang, Songchang.,Zhang, Keyue.,...&He, Yongning.(2023).Passive Intermodulation on Microstrip Induced by Microstructured Edge.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,PP(99),1-14.

Cao, Zhi,et al."Passive Intermodulation on Microstrip Induced by Microstructured Edge".IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES PP.99(2023):1-14.