南方科技大学知识苑(SUSTech KC): Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry

题名	Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry
作者	Wan, Zhen 1; Li, Cheng 1,2; Liu, Yang 1; Liu, Yujian 1; Xiao, Xi 1; Han, Song3
通讯作者	Li, Cheng; Han, Song
发表日期	2023-12-01
DOI	10.1016/j.apsusc.2023.158237
发表期刊	APPLIED SURFACE SCIENCE 影响因子和分区
ISSN	0169-4332
EISSN	1873-5584
卷号	639
摘要	Graphene optical applications rely on its exceptional optical characteristics, for which accurate measurement of graphene reflectivity is critical. Fabry-Perot (F-P) interferometry is a standard reflectivity measurement method with a simple structure, fast measurement speed, and high system plasticity. However, a strong coupling relationship exists between the coupling coefficient and the reflectivity of graphene in the F-P interferometry measurements of graphene reflectivity. Therefore, a method for measuring the reflectivity of thin graphene films using F-P interferometry with a compensation factor is proposed and experimentally demonstrated. Four alternative graphene film reflectivity solution models are established within four different F-P cavity lengths. The experimental results of the solution model with cavity lengths of 50-100 & mu;m show that the average reflectivity of single-layer, two-layer, five-layer, eight-layer, and ten-layer graphene films are 0.0131%, 0.101%, 0.793%, 1.335%, and 1.978% with the errors of 0.7%, 1.0%, 1.0%, 1.1%, and 1.1%, respectively. Meanwhile, the standard deviation of graphene reflectivity increases with the number of graphene layers. The highly consistent experimental data and comparative results confirmed the accuracy of our method. This method proposed in this paper could be further extended to measure the reflectivity of other 2-D materials.
关键词	Graphene film Optical reflectivity Fabry-Perot interference Coupling coefficient Compensation factor
相关链接	[来源记录]
收录类别	SCI ; EI
语种	英语
学校署名	通讯
资助项目	National Natural Science Foundation of China[62173021] ; Beijing Natural Science Foundation[4212039] ; Aviation Science Foundation of China[2020Z073051002] ; Science Technology and Innovation Commission of Shenzhen Municipality[JCYJ20180504165721952] ; Science and Technology Innovation Commission of Shenzhen[JCYJ20200109141201714]
WOS研究方向	Chemistry ; Materials Science ; Physics
WOS类目	Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS记录号	WOS:001061173200001
出版者	ELSEVIER
EI入藏号	20233414582069
EI主题词	Fabry-Perot interferometers ; Graphene ; Interferometry
EI分类号	Nanotechnology:761 ; Chemical Products Generally:804 ; Optical Instruments:941.3 ; Optical Variables Measurements:941.4
ESI学科分类	MATERIALS SCIENCE
Scopus记录号	2-s2.0-85167967967
来源库	Web of Science
引用统计	被引频次[WOS]：3
成果类型	期刊论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/559321
专题	创新创业学院
作者单位	1.Beihang Univ, Sch Instrumentat & Optoelect Engn, Beijing, Peoples R China 2.Univ Shenzhen, Res Inst Beihang, Shenzhen 518055, Peoples R China 3.Southern Univ Sci & Technol, Sch Innovat & Entrepreneurship, Shenzhen 518055, Peoples R China
通讯作者单位	创新创业学院
推荐引用方式 GB/T 7714	Wan, Zhen,Li, Cheng,Liu, Yang,et al. Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry[J]. APPLIED SURFACE SCIENCE,2023,639.
APA	Wan, Zhen,Li, Cheng,Liu, Yang,Liu, Yujian,Xiao, Xi,&Han, Song.(2023).Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry.APPLIED SURFACE SCIENCE,639.
MLA	Wan, Zhen,et al."Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry".APPLIED SURFACE SCIENCE 639(2023).