中文版 | English
题名

Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction

作者
通讯作者Wang,Xiaoyi; Qiu,Yang
发表日期
2023-09-04
DOI
发表期刊
ISSN
0003-6951
卷号123期号:10
摘要
The investigation of chemical reactions during ion irradiation is a frontier for the study of the ion-material interaction. In order to probe the chemistry of ion produced nanoclusters, valence electron energy loss spectroscopy (VEELS) was exploited to investigate Ga ion damage in AlO, InP, and InGaAs, where each target material has been shown to react differently to the interaction between impinging ions, recoil atoms, and vacancies: metallic Ga, ternary InGaP clusters, and metallic In clusters are formed in AlO, InP, and InGaAs, respectively. Supporting simulations based on Monte Carlo and crystal orbital Hamiltonian calculations indicate that the chemical constitution of cascade induced nano-precipitates is a result of a competition between interstitial/vacancy consumption rates and preferential bond formation due to differing bond strengths.
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
重要成果
NI论文
学校署名
通讯
WOS记录号
WOS:001074765700008
EI入藏号
20233714731745
EI主题词
Alumina ; Aluminum oxide ; Bond strength (materials) ; Chemical bonds ; Electron energy levels ; Electron energy loss spectroscopy ; Electron scattering ; Energy dissipation ; III-V semiconductors ; Ion beams ; Ion bombardment ; Ions ; Monte Carlo methods ; Semiconducting indium gallium arsenide ; Semiconducting indium phosphide
EI分类号
Energy Losses (industrial and residential):525.4 ; Semiconducting Materials:712.1 ; Compound Semiconducting Materials:712.1.2 ; Physical Chemistry:801.4 ; Inorganic Compounds:804.2 ; Mathematical Statistics:922.2 ; High Energy Physics:932.1 ; Materials Science:951
ESI学科分类
PHYSICS
Scopus记录号
2-s2.0-85170825835
来源库
Scopus
引用统计
被引频次[WOS]:1
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/559631
专题公共分析测试中心
作者单位
1.Southwest Minzu University,State Ethnic Affairs Commission,Chengdu,610041,China
2.NCS Testing Technology Co. Ltd,Chengdu,610041,China
3.SUSTech Core Research Facilities,Southern University of Science and Technology,Shenzhen,518055,China
4.Key Laboratory of Radiation Physics and Technology of Ministry of Education,Institute of Nuclear Science and Technology,Sichuan University,Chengdu,610064,China
5.College of Physical Science and Technology,Sichuan University,Chengdu,610064,China
6.Laboratory for Shock Wave and Detonation Physics,Institute of Fluid Physics,China Academy of Engineering Physics,Sichuan,Mianyang ,621900,China
7.Sichuan Research Center of New Materials,Chengdu,596 Yinhe Road, Shuangliu ,610200,China
8.Yongjiang Laboratory,Ningbo,315000,China
9.Institute of Chemical Materials,China Academy of Engineering Physics,Mianyang,621900,China
10.Department Electronic and Electrical Engineering,University of Sheffield,Sheffield,Mappin St.,S1 3JD,United Kingdom
通讯作者单位公共分析测试中心
推荐引用方式
GB/T 7714
Ma,Zhenyu,Zhang,Xin,Liu,Pu,et al. Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction[J]. Applied Physics Letters,2023,123(10).
APA
Ma,Zhenyu.,Zhang,Xin.,Liu,Pu.,Deng,Yong.,Hu,Wenyu.,...&Walther,Thomas.(2023).Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction.Applied Physics Letters,123(10).
MLA
Ma,Zhenyu,et al."Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction".Applied Physics Letters 123.10(2023).
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