题名 | Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction |
作者 | |
通讯作者 | Wang,Xiaoyi; Qiu,Yang |
发表日期 | 2023-09-04
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DOI | |
发表期刊 | |
ISSN | 0003-6951
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卷号 | 123期号:10 |
摘要 | The investigation of chemical reactions during ion irradiation is a frontier for the study of the ion-material interaction. In order to probe the chemistry of ion produced nanoclusters, valence electron energy loss spectroscopy (VEELS) was exploited to investigate Ga ion damage in AlO, InP, and InGaAs, where each target material has been shown to react differently to the interaction between impinging ions, recoil atoms, and vacancies: metallic Ga, ternary InGaP clusters, and metallic In clusters are formed in AlO, InP, and InGaAs, respectively. Supporting simulations based on Monte Carlo and crystal orbital Hamiltonian calculations indicate that the chemical constitution of cascade induced nano-precipitates is a result of a competition between interstitial/vacancy consumption rates and preferential bond formation due to differing bond strengths. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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重要成果 | NI论文
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学校署名 | 通讯
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WOS记录号 | WOS:001074765700008
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EI入藏号 | 20233714731745
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EI主题词 | Alumina
; Aluminum oxide
; Bond strength (materials)
; Chemical bonds
; Electron energy levels
; Electron energy loss spectroscopy
; Electron scattering
; Energy dissipation
; III-V semiconductors
; Ion beams
; Ion bombardment
; Ions
; Monte Carlo methods
; Semiconducting indium gallium arsenide
; Semiconducting indium phosphide
|
EI分类号 | Energy Losses (industrial and residential):525.4
; Semiconducting Materials:712.1
; Compound Semiconducting Materials:712.1.2
; Physical Chemistry:801.4
; Inorganic Compounds:804.2
; Mathematical Statistics:922.2
; High Energy Physics:932.1
; Materials Science:951
|
ESI学科分类 | PHYSICS
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Scopus记录号 | 2-s2.0-85170825835
|
来源库 | Scopus
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引用统计 |
被引频次[WOS]:1
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/559631 |
专题 | 公共分析测试中心 |
作者单位 | 1.Southwest Minzu University,State Ethnic Affairs Commission,Chengdu,610041,China 2.NCS Testing Technology Co. Ltd,Chengdu,610041,China 3.SUSTech Core Research Facilities,Southern University of Science and Technology,Shenzhen,518055,China 4.Key Laboratory of Radiation Physics and Technology of Ministry of Education,Institute of Nuclear Science and Technology,Sichuan University,Chengdu,610064,China 5.College of Physical Science and Technology,Sichuan University,Chengdu,610064,China 6.Laboratory for Shock Wave and Detonation Physics,Institute of Fluid Physics,China Academy of Engineering Physics,Sichuan,Mianyang ,621900,China 7.Sichuan Research Center of New Materials,Chengdu,596 Yinhe Road, Shuangliu ,610200,China 8.Yongjiang Laboratory,Ningbo,315000,China 9.Institute of Chemical Materials,China Academy of Engineering Physics,Mianyang,621900,China 10.Department Electronic and Electrical Engineering,University of Sheffield,Sheffield,Mappin St.,S1 3JD,United Kingdom |
通讯作者单位 | 公共分析测试中心 |
推荐引用方式 GB/T 7714 |
Ma,Zhenyu,Zhang,Xin,Liu,Pu,et al. Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction[J]. Applied Physics Letters,2023,123(10).
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APA |
Ma,Zhenyu.,Zhang,Xin.,Liu,Pu.,Deng,Yong.,Hu,Wenyu.,...&Walther,Thomas.(2023).Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction.Applied Physics Letters,123(10).
|
MLA |
Ma,Zhenyu,et al."Clustering in gallium ion beam sputtered compound materials driven by bond strength and interstitial/vacancy reaction".Applied Physics Letters 123.10(2023).
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条目包含的文件 | 条目无相关文件。 |
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