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题名

Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation

作者
通讯作者Xie,Maohai
发表日期
2023-07-01
DOI
发表期刊
ISSN
2166-532X
EISSN
2166-532X
卷号11期号:7
摘要
Monolayer (ML) transition-metal dichalcogenides (TMDs) have attracted a lot of research interest in recent years due to their many interesting properties as well as their application promises. Depending on the specific combinations of metals (e.g., Mo and W) with chalcogen elements (e.g., S, Se, and Te), binary TMDs exhibit a wide spectrum of physical characteristics, e.g., from metal to semiconductor and/or superconductor. Extension from binary to ternary compounds and alloys may offer even wider variations of properties and are thus of interest from both fundamental and practical points of view. In this work, we substitute Mo for niobium (Nb) and rhenium (Re) in ML MoSe during molecular-beam epitaxy and probe their effects on structural and electrical properties. We find that low-concentration Nb and Re in ML-MoSe are both shallow dopants, with Re being an electron donor and Nb acceptor, respectively. By changing Nb(Re)/Mo flux ratios, we can effectively tune the Fermi level by varying electron or hole concentrations in MoSe. On the other hand, both Nb and Re are found to cause mirror-twin domain boundary defects to proliferate in MoSe
相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
Research Grant Council of the Hong Kong Special Administrative Region, China["AoE/P-701/20","N_HKU732"] ; National Natural Science Foundation of China["61721005","51761165024"] ; Zhejiang Provincial Natural Science Foundation[LD19E020002]
WOS研究方向
Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号
WOS:001031327500003
出版者
EI入藏号
20233014440642
EI主题词
Binary alloys ; Defects ; Molecular beam epitaxy ; Molecular beams ; Molybdenum ; Monolayers ; Rhenium ; Rhenium compounds ; Selenium compounds ; Semiconductor doping
EI分类号
Molybdenum and Alloys:543.3 ; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3 ; Semiconducting Materials:712.1 ; Atomic and Molecular Physics:931.3 ; Crystal Growth:933.1.2 ; Materials Science:951
Scopus记录号
2-s2.0-85165534116
来源库
Scopus
引用统计
被引频次[WOS]:2
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/559881
专题理学院_物理系
作者单位
1.Physics Department,Guangdong-Hong Kong Joint Laboratory of Quantum Matter,The University of Hong Kong,Hong Kong
2.State Key Laboratory of Silicon and Advanced Semiconductor Materials,School of Materials and Engineering,Zhejiang University,Hangzhou,Zhejiang,310027,China
3.Department of Physics,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China
推荐引用方式
GB/T 7714
Zhang,Junqiu,Xia,Yipu,Yu,Zhoubin,et al. Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation[J]. APL Materials,2023,11(7).
APA
Zhang,Junqiu.,Xia,Yipu.,Yu,Zhoubin.,Yue,Xingyu.,Jin,Yuanjun.,...&Xie,Maohai.(2023).Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation.APL Materials,11(7).
MLA
Zhang,Junqiu,et al."Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation".APL Materials 11.7(2023).
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