题名 | Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation |
作者 | |
通讯作者 | Xie,Maohai |
发表日期 | 2023-07-01
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DOI | |
发表期刊 | |
ISSN | 2166-532X
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EISSN | 2166-532X
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卷号 | 11期号:7 |
摘要 | Monolayer (ML) transition-metal dichalcogenides (TMDs) have attracted a lot of research interest in recent years due to their many interesting properties as well as their application promises. Depending on the specific combinations of metals (e.g., Mo and W) with chalcogen elements (e.g., S, Se, and Te), binary TMDs exhibit a wide spectrum of physical characteristics, e.g., from metal to semiconductor and/or superconductor. Extension from binary to ternary compounds and alloys may offer even wider variations of properties and are thus of interest from both fundamental and practical points of view. In this work, we substitute Mo for niobium (Nb) and rhenium (Re) in ML MoSe during molecular-beam epitaxy and probe their effects on structural and electrical properties. We find that low-concentration Nb and Re in ML-MoSe are both shallow dopants, with Re being an electron donor and Nb acceptor, respectively. By changing Nb(Re)/Mo flux ratios, we can effectively tune the Fermi level by varying electron or hole concentrations in MoSe. On the other hand, both Nb and Re are found to cause mirror-twin domain boundary defects to proliferate in MoSe |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | Research Grant Council of the Hong Kong Special Administrative Region, China["AoE/P-701/20","N_HKU732"]
; National Natural Science Foundation of China["61721005","51761165024"]
; Zhejiang Provincial Natural Science Foundation[LD19E020002]
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WOS研究方向 | Science & Technology - Other Topics
; Materials Science
; Physics
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WOS类目 | Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Applied
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WOS记录号 | WOS:001031327500003
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出版者 | |
EI入藏号 | 20233014440642
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EI主题词 | Binary alloys
; Defects
; Molecular beam epitaxy
; Molecular beams
; Molybdenum
; Monolayers
; Rhenium
; Rhenium compounds
; Selenium compounds
; Semiconductor doping
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EI分类号 | Molybdenum and Alloys:543.3
; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3
; Semiconducting Materials:712.1
; Atomic and Molecular Physics:931.3
; Crystal Growth:933.1.2
; Materials Science:951
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Scopus记录号 | 2-s2.0-85165534116
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:2
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/559881 |
专题 | 理学院_物理系 |
作者单位 | 1.Physics Department,Guangdong-Hong Kong Joint Laboratory of Quantum Matter,The University of Hong Kong,Hong Kong 2.State Key Laboratory of Silicon and Advanced Semiconductor Materials,School of Materials and Engineering,Zhejiang University,Hangzhou,Zhejiang,310027,China 3.Department of Physics,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China |
推荐引用方式 GB/T 7714 |
Zhang,Junqiu,Xia,Yipu,Yu,Zhoubin,et al. Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation[J]. APL Materials,2023,11(7).
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APA |
Zhang,Junqiu.,Xia,Yipu.,Yu,Zhoubin.,Yue,Xingyu.,Jin,Yuanjun.,...&Xie,Maohai.(2023).Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation.APL Materials,11(7).
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MLA |
Zhang,Junqiu,et al."Niobium and rhenium doping in MoSe2 monolayer during molecular beam epitaxy: Shallow dopants and defect proliferation".APL Materials 11.7(2023).
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