题名 | A General and Ultrafast Polishing Method with Truly Atomic Roughness |
作者 | |
通讯作者 | Deng, Hui |
发表日期 | 2023-10-12
|
DOI | |
发表期刊 | |
ISSN | 1948-7185
|
卷号 | 14期号:42页码:9441-9447 |
摘要 | The advancement of science and technology is always accompanied by better manufacturing precision. Ideally, the highest precision for manufacturing a surface is truly atomic flatness, which implies that all topmost surface atoms are in a single layer of the crystal face. However, almost no methods can achieve this surface with high efficiency at present. Herein, we present a method to fabricate a large-scale truly atomically flat surface with ultrafast speed. Through the selective etching of surface atoms, our method can achieve an atomically flat surface with 0.05 nm Sa roughness. It is notable that the polishing efficiency of our method is more than 1000 times higher than that of conventional methods. We have demonstrated its generality on various single-crystal materials and obtained atomic roughness and an ultrahigh polishing rate. This method has the potential to promote the mass-production of atomic-scale smooth surfaces, the application of third-generation semiconductor materials, and the innovation of advanced technologies. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
重要成果 | NI论文
|
学校署名 | 第一
; 通讯
|
资助项目 | National Natural Science Foundation of China[52005243]
; Science and Technology Innovation Committee of Shenzhen Municipality["JCYJ20220818100412027","JCYJ20210324120402007"]
|
WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
; Physics
|
WOS类目 | Chemistry, Physical
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Atomic, Molecular & Chemical
|
WOS记录号 | WOS:001090563200001
|
出版者 | |
EI入藏号 | 20234715095421
|
EI主题词 | Atoms
; Efficiency
; Etching
; Polishing
; Semiconductor materials
; Single crystals
|
EI分类号 | Machining Operations:604.2
; Semiconducting Materials:712.1
; Chemical Reactions:802.2
; Production Engineering:913.1
; Physical Properties of Gases, Liquids and Solids:931.2
; Atomic and Molecular Physics:931.3
; Crystalline Solids:933.1
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:3
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/582778 |
专题 | 工学院_机械与能源工程系 前沿与交叉科学研究院 工学院_材料科学与工程系 |
作者单位 | 1.Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Guangdong, Peoples R China 2.Univ East Anglia, Fac Sci, Sch Engn, Norwich NR4 7TJ, England 3.Natl Univ Singapore, Dept Phys, Singapore 117551, Singapore 4.Natl Univ Singapore, Ctr Adv Mat 2D, Singapore 117551, Singapore 5.Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Guangdong, Peoples R China 6.Southern Univ Sci & Technol, Acad Adv Interdisciplinary Studies, Shenzhen 518055, Guangdong, Peoples R China |
第一作者单位 | 机械与能源工程系 |
通讯作者单位 | 机械与能源工程系 |
第一作者的第一单位 | 机械与能源工程系 |
推荐引用方式 GB/T 7714 |
Zhang, Yi,Zhang, Yongjie,Gu, Kaixuan,et al. A General and Ultrafast Polishing Method with Truly Atomic Roughness[J]. JOURNAL OF PHYSICAL CHEMISTRY LETTERS,2023,14(42):9441-9447.
|
APA |
Zhang, Yi.,Zhang, Yongjie.,Gu, Kaixuan.,Zhang, Linfeng.,Zhu, Yuanmin.,...&Deng, Hui.(2023).A General and Ultrafast Polishing Method with Truly Atomic Roughness.JOURNAL OF PHYSICAL CHEMISTRY LETTERS,14(42),9441-9447.
|
MLA |
Zhang, Yi,et al."A General and Ultrafast Polishing Method with Truly Atomic Roughness".JOURNAL OF PHYSICAL CHEMISTRY LETTERS 14.42(2023):9441-9447.
|
条目包含的文件 | 条目无相关文件。 |
|
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论