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题名

Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes

作者
通讯作者Chen, Shuming
发表日期
2023-12-01
DOI
发表期刊
ISSN
0935-9648
EISSN
1521-4095
卷号36期号:7
摘要
["The poor stability of blue quantum-dot (QD) light-emitting diodes (B-QLEDs) hinders their application in displays. To improve the stability of B-QLEDs, the degradation mechanism should be revealed. Here, the degradation mechanism of B-QLEDs is investigated by monitoring the changes occurring in the QDs and the hole transport layers (HTL) during device operation, respectively. It is revealed that the accumulation of electrons within the QDs is responsible for the degradation of the devices. On the one hand, the accumulated electrons induce the detachment of oleic acid ligands, leading to permanent damage to the stability of B-QDs. On the other hand, the accumulated electrons leak into the HTL or recombine at the HTL/QDs interface, leading to the degradation of HTL. The formation of surface defects in B-QDs and the decomposition of HTL contribute to the degradation of B-QLEDs. The results reveal the strong dependence of B-QLEDs stability on the accumulated electrons, the QDs and the HTL, which can help researchers to develop effective design strategies for improving the lifespan of B-QLEDs.","It is revealed that the accumulation of electrons within the quantum-dots (QDs) is responsible for the degradation of blue quantum-dot light-emitting diodes. On the one hand, the accumulated electrons induce the detachment of oleic acid ligands, leading to permanent damage to the stability of QDs. On the other hand, the accumulated electrons leak into the hole transport layer (HTL), leading to the degradation of HTL.image"]
关键词
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
重要成果
NI论文
学校署名
第一 ; 通讯
资助项目
Shenzhen Science and Technology Program["JCYJ20230807093604009","JCYJ20210324105400002"] ; null[62174075]
WOS研究方向
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目
Chemistry, Multidisciplinary ; Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号
WOS:001118507200001
出版者
EI入藏号
20235015194634
EI主题词
Degradation ; Electrons ; Nanocrystals ; Organic light emitting diodes (OLED) ; Stability ; Surface defects
EI分类号
Semiconductor Devices and Integrated Circuits:714.2 ; Nanotechnology:761 ; Chemical Reactions:802.2 ; Crystalline Solids:933.1 ; Materials Science:951
ESI学科分类
MATERIALS SCIENCE
Scopus记录号
2-s2.0-85179373312
来源库
Web of Science
引用统计
被引频次[WOS]:18
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/638892
专题工学院_电子与电气工程系
作者单位
Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
第一作者单位电子与电气工程系
通讯作者单位电子与电气工程系
第一作者的第一单位电子与电气工程系
推荐引用方式
GB/T 7714
Gao, Peili,Chen, Zinan,Chen, Shuming. Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes[J]. ADVANCED MATERIALS,2023,36(7).
APA
Gao, Peili,Chen, Zinan,&Chen, Shuming.(2023).Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes.ADVANCED MATERIALS,36(7).
MLA
Gao, Peili,et al."Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes".ADVANCED MATERIALS 36.7(2023).
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