题名 | Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes |
作者 | |
通讯作者 | Chen, Shuming |
发表日期 | 2023-12-01
|
DOI | |
发表期刊 | |
ISSN | 0935-9648
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EISSN | 1521-4095
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卷号 | 36期号:7 |
摘要 | ["The poor stability of blue quantum-dot (QD) light-emitting diodes (B-QLEDs) hinders their application in displays. To improve the stability of B-QLEDs, the degradation mechanism should be revealed. Here, the degradation mechanism of B-QLEDs is investigated by monitoring the changes occurring in the QDs and the hole transport layers (HTL) during device operation, respectively. It is revealed that the accumulation of electrons within the QDs is responsible for the degradation of the devices. On the one hand, the accumulated electrons induce the detachment of oleic acid ligands, leading to permanent damage to the stability of B-QDs. On the other hand, the accumulated electrons leak into the HTL or recombine at the HTL/QDs interface, leading to the degradation of HTL. The formation of surface defects in B-QDs and the decomposition of HTL contribute to the degradation of B-QLEDs. The results reveal the strong dependence of B-QLEDs stability on the accumulated electrons, the QDs and the HTL, which can help researchers to develop effective design strategies for improving the lifespan of B-QLEDs.","It is revealed that the accumulation of electrons within the quantum-dots (QDs) is responsible for the degradation of blue quantum-dot light-emitting diodes. On the one hand, the accumulated electrons induce the detachment of oleic acid ligands, leading to permanent damage to the stability of QDs. On the other hand, the accumulated electrons leak into the hole transport layer (HTL), leading to the degradation of HTL.image"] |
关键词 | |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
重要成果 | NI论文
|
学校署名 | 第一
; 通讯
|
资助项目 | Shenzhen Science and Technology Program["JCYJ20230807093604009","JCYJ20210324105400002"]
; null[62174075]
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WOS研究方向 | Chemistry
; Science & Technology - Other Topics
; Materials Science
; Physics
|
WOS类目 | Chemistry, Multidisciplinary
; Chemistry, Physical
; Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
; Physics, Applied
; Physics, Condensed Matter
|
WOS记录号 | WOS:001118507200001
|
出版者 | |
EI入藏号 | 20235015194634
|
EI主题词 | Degradation
; Electrons
; Nanocrystals
; Organic light emitting diodes (OLED)
; Stability
; Surface defects
|
EI分类号 | Semiconductor Devices and Integrated Circuits:714.2
; Nanotechnology:761
; Chemical Reactions:802.2
; Crystalline Solids:933.1
; Materials Science:951
|
ESI学科分类 | MATERIALS SCIENCE
|
Scopus记录号 | 2-s2.0-85179373312
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:18
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/638892 |
专题 | 工学院_电子与电气工程系 |
作者单位 | Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Gao, Peili,Chen, Zinan,Chen, Shuming. Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes[J]. ADVANCED MATERIALS,2023,36(7).
|
APA |
Gao, Peili,Chen, Zinan,&Chen, Shuming.(2023).Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes.ADVANCED MATERIALS,36(7).
|
MLA |
Gao, Peili,et al."Electron-Induced Degradation in Blue Quantum-Dot Light-Emitting Diodes".ADVANCED MATERIALS 36.7(2023).
|
条目包含的文件 | 条目无相关文件。 |
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