题名 | Atomic-scale smoothing of semiconducting oxides via plasma-enabled atomic-scale reconstruction |
作者 | |
通讯作者 | Deng,Hui |
发表日期 | 2024-03-01
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DOI | |
发表期刊 | |
ISSN | 0890-6955
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卷号 | 196 |
摘要 | β-GaO, known as a next-generation wide-bandgap transparent semiconducting oxide (TSO), has considerable application potential in ultra-high-power and high-temperature devices. However, fabricating a smooth β-GaO substrate is challenging owing to its strong mechanical strength and chemical stability. In this study, an atomic-scale smoothing method named plasma-enabled atomic-scale reconstruction (PEAR) is proposed. We find that three reconstruction modes, namely, 2D-island, step-flow, and step-bunching, can be identified with the increase in the input power; only the step-flow mode can result in the formation of an atomically smooth β-GaO surface (Sa = 0.098 nm). Various surface and subsurface characterizations indicate that the smooth β-GaO surface shows excellent surface integrity, high crystalline quality, and remarkable photoelectric properties. The atomic-scale density functional theory-based calculations show that the diffusion energy barrier of a Ga atom is only 0.46 eV, thereby supporting the atomic mass migration induced by high-energy plasma irradiation in the experiment. Nanoscale molecular dynamics simulations reveal that O atoms firstly migrate to crystallization sites, followed by Ga atoms with a lower migration rate; reconstruction mainly proceeds along the <010> direction and then expands along the <100> and <001> directions. The millimeter-scale numerical simulations based on the finite element method demonstrate that the coupling of the thermal and flow fields of plasma is the impetus for PEAR of β-GaO. Furthermore, the smoothing generality of PEAR is demonstrated by extending it to other common TSOs (α-AlO, ZnO, and MgO). As a typical plasma-based atomic-scale smoothing method, PEAR is expected to enrich the theoretical and technological knowledge on atomic-scale manufacturing. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 第一
; 通讯
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ESI学科分类 | ENGINEERING
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Scopus记录号 | 2-s2.0-85182269820
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来源库 | Scopus
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引用统计 |
被引频次[WOS]:3
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/701408 |
专题 | 工学院_机械与能源工程系 工学院_电子与电气工程系 |
作者单位 | 1.Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China 2.Department of Physics and Centre for Advanced 2D Materials,National University of Singapore,2 Science Drive 3, Singapore,117551,Singapore 3.Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China |
第一作者单位 | 机械与能源工程系 |
通讯作者单位 | 机械与能源工程系 |
第一作者的第一单位 | 机械与能源工程系 |
推荐引用方式 GB/T 7714 |
Zhang,Yongjie,Tang,Jin,Liang,Shaoxiang,et al. Atomic-scale smoothing of semiconducting oxides via plasma-enabled atomic-scale reconstruction[J]. International Journal of Machine Tools and Manufacture,2024,196.
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APA |
Zhang,Yongjie.,Tang,Jin.,Liang,Shaoxiang.,Zhao,Junlei.,Hua,Mengyuan.,...&Deng,Hui.(2024).Atomic-scale smoothing of semiconducting oxides via plasma-enabled atomic-scale reconstruction.International Journal of Machine Tools and Manufacture,196.
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MLA |
Zhang,Yongjie,et al."Atomic-scale smoothing of semiconducting oxides via plasma-enabled atomic-scale reconstruction".International Journal of Machine Tools and Manufacture 196(2024).
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条目包含的文件 | 条目无相关文件。 |
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