题名 | Orientation-dependent atomic-scale mechanism and defect evolution in β-Ga2O3 thin film epitaxial growth |
作者 | |
通讯作者 | Hua,Mengyuan |
发表日期 | 2024-01-08
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DOI | |
发表期刊 | |
ISSN | 0003-6951
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卷号 | 124期号:2 |
摘要 | β-GaO has been subjected to intense research interest as an ultrawide bandgap semiconductor. The epitaxial growth technique of β-GaO thin films plays a fundamental and vital role in GaO-based device fabrication. In this work, the epitaxial growth mechanisms of β-GaO on four low-Miller-index facets, (100), (010), (001), and ( 2 ¯ 01 ), are systematically explored using large-scale machine-learning molecular dynamics simulations at the atomic scale. The simulations reveal that the migration of the face-centered cubic stacking O sublattice plays a dominant role in the different growth mechanisms between the (100)/(010)/(001) and ( 2 ¯ 01 ) orientations. The resultant complex combinations of the stacking faults and twin boundaries are carefully identified and show good agreement with experimental observations and ab initio calculations. Our results provide useful insights into the gas-phase epitaxial growth of β-GaO thin films and suggest possible ways to tailor its properties for specific applications. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 第一
; 通讯
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ESI学科分类 | PHYSICS
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Scopus记录号 | 2-s2.0-85181978200
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来源库 | Scopus
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引用统计 | |
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/701610 |
专题 | 工学院_电子与电气工程系 |
作者单位 | Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
第一作者单位 | 电子与电气工程系 |
通讯作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Zhang,Jun,Zhao,Junlei,Chen,Junting,et al. Orientation-dependent atomic-scale mechanism and defect evolution in β-Ga2O3 thin film epitaxial growth[J]. Applied Physics Letters,2024,124(2).
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APA |
Zhang,Jun,Zhao,Junlei,Chen,Junting,&Hua,Mengyuan.(2024).Orientation-dependent atomic-scale mechanism and defect evolution in β-Ga2O3 thin film epitaxial growth.Applied Physics Letters,124(2).
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MLA |
Zhang,Jun,et al."Orientation-dependent atomic-scale mechanism and defect evolution in β-Ga2O3 thin film epitaxial growth".Applied Physics Letters 124.2(2024).
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