题名 | An Automatic Offset Compensation Sense Amplifier Featuring High Readout Reliability for SRAM |
作者 | |
通讯作者 | Li, Shurun |
DOI | |
发表日期 | 2023
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会议名称 | 20th International SoC Design Conference, ISOCC 2023
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ISSN | 2163-9612
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ISBN | 9798350327038
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会议录名称 | |
页码 | 23-24
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会议日期 | October 25, 2023 - October 28, 2023
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会议地点 | Jeju, Korea, Republic of
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会议录编者/会议主办者 | IEEE Circuits and Systems (CAS) Society
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出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA
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出版者 | |
摘要 | With technology nodes aggressive scaling down, offset voltage has been emerging as one of the critical readout reliability issues of SRAM. This paper proposes a method named automatic compensation sense amplifier (ACSA), to tackle it by identifying the direction of offset and compensating automatically. This method obtains and stores the offset direction through one-time sensing, and then auxiliary transistors in corresponding branches are turned on for current compensation. The circuit implementation of the method is evaluated with SMIC 55-nm technology, operated at a supply voltage of 1.2 V. The proposed ACSA achieves a 66.19% reduction in voltage offset compared to conventional Current Launch SA (CLSA), and a 30.6% reduction compared to conventional Voltage Launch SA (VLSA). © 2023 IEEE. |
关键词 | |
学校署名 | 其他
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语种 | 英语
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相关链接 | [IEEE记录] |
收录类别 | |
WOS研究方向 | Computer Science
; Engineering
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WOS类目 | Computer Science, Hardware & Architecture
; Computer Science, Theory & Methods
; Engineering, Electrical & Electronic
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WOS记录号 | WOS:001169439300012
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EI入藏号 | 20240715554046
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来源库 | EV Compendex
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全文链接 | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10396553 |
引用统计 | |
成果类型 | 会议论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/706914 |
专题 | 南方科技大学 |
作者单位 | 1.Shanghai University, School of Microelectronics, Shanghai; 200444, China 2.Southern University of Science and Technology, Shenzhen; 518055, China |
推荐引用方式 GB/T 7714 |
Li, Shurun,Liang, Jie,Zhang, Liuyang. An Automatic Offset Compensation Sense Amplifier Featuring High Readout Reliability for SRAM[C]//IEEE Circuits and Systems (CAS) Society. 345 E 47TH ST, NEW YORK, NY 10017 USA:Institute of Electrical and Electronics Engineers Inc.,2023:23-24.
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条目包含的文件 | 条目无相关文件。 |
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