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题名

HyFET—A GaN/SiC Hybrid Field-Effect Transistor

作者
DOI
发表日期
2023
ISSN
0163-1918
ISBN
979-8-3503-2768-7
会议录名称
页码
1-4
会议日期
9-13 Dec. 2023
会议地点
San Francisco, CA, USA
摘要
We experimentally demonstrate a GaN/SiC hybrid field-effect transistor (HyFET)—a novel power electron device that can harness the complementary merits of GaN and SiC and circumvent their notorious drawbacks. The HyFET regulates currents by gating an AlGaN/GaN high-mobility 2- dimensional-electron-gas (2DEG) channel and blocks voltages with a vertical SiC junction-field-effect-transistor (JFET) structure. The channel mobility can be boosted by ~100 times compared to a SiC MOS-channel. The HyFET can be vertically configured to provide voltage blocking with avalanche capability and be free of the dynamic ON-resistance issue, which are difficult for GaN HEMTs. Critical technology enablers for implementing the GaN/SiC HyFET include a dual-epitaxy SiC JFET structure, GaN epitaxy on patterned 4°- off-axis 4H-SiC substrate, and a Damascene-process-based in- cell interconnection solution. Our experimental demonstration unveils a new power device platform that gears toward the utmost integration of these two prevailing wide-bandgap semiconductors.
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IEEE
全文链接https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10413796
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成果类型会议论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/719091
专题南方科技大学
作者单位
1.The Hong Kong University of Science and Technology, Hong Kong, China
2.Enkris Semiconductor. Inc, China
3.Southern University of Science and Technology, China
4.Peking University, China
推荐引用方式
GB/T 7714
Sirui Feng,Zheyang Zheng,Yuru Wang,等. HyFET—A GaN/SiC Hybrid Field-Effect Transistor[C],2023:1-4.
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