题名 | General method for complex-wave fields registration with high fidelity |
作者 | |
通讯作者 | Zhang,Fucai |
发表日期 | 2020-02-03
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DOI | |
发表期刊 | |
ISSN | 10944087
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EISSN | 1094-4087
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卷号 | 28期号:3页码:4204-4215 |
摘要 | In the field of optical imaging, the image registration method could be applied to realize a large field of view along with high resolution. The traditional image registration methods are mostly conceived for intensity images and might fail for complex-valued images. Especially, those methods do not account for the random phase offset associated with phase. In this paper, we proposed a general method for complex-wave field registration. A similar procedure has been proposed for the reconstruction of the ptychographic dataset, but here is modified for the registration of general wave fields. The method can efficiently separate the illumination and object function, refine the positions of each wavefront, and thus provide a stitched wide-field object wave with high fidelity. Simulation and experimental results applied to register the wave fields obtained from digital holographic microscopy are given to verify the feasibility of the method. This method would have potential applications in large-field high-resolution microscopy, adaptive imaging, remote sensing and the measurement of structured optical fields. |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
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资助项目 | Beijing Nova Program[XX2018072]
; [KZ202010005008]
; National Natural Science Foundation of China[61675010]
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WOS研究方向 | Optics
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WOS类目 | Optics
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WOS记录号 | WOS:000514570800128
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出版者 | |
EI入藏号 | 20200608125217
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EI主题词 | Image Registration
; Microscopic Examination
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EI分类号 | Data Processing And Image Processing:723.2
; Imaging Techniques:746
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ESI学科分类 | PHYSICS
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Scopus记录号 | 2-s2.0-85078817149
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来源库 | Scopus
|
引用统计 |
被引频次[WOS]:1
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/74160 |
专题 | 工学院 工学院_电子与电气工程系 |
作者单位 | 1.College of Applied Sciences,Beijing University of Technology,Beijing,100124,China 2.Department of Electrical and Electronic Engineering,College of Engineering,Southern University of Science and Technology,Shenzhen,518000,China 3.Henan Institute of Metrology,Zhengzhou,450047,China |
通讯作者单位 | 工学院; 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Zhao,Jie,Zhang,Fucai,Wang,Dayong,et al. General method for complex-wave fields registration with high fidelity[J]. Optics Express,2020,28(3):4204-4215.
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APA |
Zhao,Jie,Zhang,Fucai,Wang,Dayong,&Zhu,Weimin.(2020).General method for complex-wave fields registration with high fidelity.Optics Express,28(3),4204-4215.
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MLA |
Zhao,Jie,et al."General method for complex-wave fields registration with high fidelity".Optics Express 28.3(2020):4204-4215.
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条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 | 操作 | |
OE wavefront stichin(2402KB) | -- | -- | 开放获取 | -- | 浏览 |
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