中文版 | English
题名

General method for complex-wave fields registration with high fidelity

作者
通讯作者Zhang,Fucai
发表日期
2020-02-03
DOI
发表期刊
ISSN
10944087
EISSN
1094-4087
卷号28期号:3页码:4204-4215
摘要

In the field of optical imaging, the image registration method could be applied to realize a large field of view along with high resolution. The traditional image registration methods are mostly conceived for intensity images and might fail for complex-valued images. Especially, those methods do not account for the random phase offset associated with phase. In this paper, we proposed a general method for complex-wave field registration. A similar procedure has been proposed for the reconstruction of the ptychographic dataset, but here is modified for the registration of general wave fields. The method can efficiently separate the illumination and object function, refine the positions of each wavefront, and thus provide a stitched wide-field object wave with high fidelity. Simulation and experimental results applied to register the wave fields obtained from digital holographic microscopy are given to verify the feasibility of the method. This method would have potential applications in large-field high-resolution microscopy, adaptive imaging, remote sensing and the measurement of structured optical fields.

相关链接[Scopus记录]
收录类别
SCI ; EI
语种
英语
学校署名
通讯
资助项目
Beijing Nova Program[XX2018072] ; [KZ202010005008] ; National Natural Science Foundation of China[61675010]
WOS研究方向
Optics
WOS类目
Optics
WOS记录号
WOS:000514570800128
出版者
EI入藏号
20200608125217
EI主题词
Image Registration ; Microscopic Examination
EI分类号
Data Processing And Image Processing:723.2 ; Imaging Techniques:746
ESI学科分类
PHYSICS
Scopus记录号
2-s2.0-85078817149
来源库
Scopus
引用统计
被引频次[WOS]:1
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/74160
专题工学院
工学院_电子与电气工程系
作者单位
1.College of Applied Sciences,Beijing University of Technology,Beijing,100124,China
2.Department of Electrical and Electronic Engineering,College of Engineering,Southern University of Science and Technology,Shenzhen,518000,China
3.Henan Institute of Metrology,Zhengzhou,450047,China
通讯作者单位工学院;  电子与电气工程系
推荐引用方式
GB/T 7714
Zhao,Jie,Zhang,Fucai,Wang,Dayong,et al. General method for complex-wave fields registration with high fidelity[J]. Optics Express,2020,28(3):4204-4215.
APA
Zhao,Jie,Zhang,Fucai,Wang,Dayong,&Zhu,Weimin.(2020).General method for complex-wave fields registration with high fidelity.Optics Express,28(3),4204-4215.
MLA
Zhao,Jie,et al."General method for complex-wave fields registration with high fidelity".Optics Express 28.3(2020):4204-4215.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可 操作
OE wavefront stichin(2402KB)----开放获取--浏览
个性服务
原文链接
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
导出为Excel格式
导出为Csv格式
Altmetrics Score
谷歌学术
谷歌学术中相似的文章
[Zhao,Jie]的文章
[Zhang,Fucai]的文章
[Wang,Dayong]的文章
百度学术
百度学术中相似的文章
[Zhao,Jie]的文章
[Zhang,Fucai]的文章
[Wang,Dayong]的文章
必应学术
必应学术中相似的文章
[Zhao,Jie]的文章
[Zhang,Fucai]的文章
[Wang,Dayong]的文章
相关权益政策
暂无数据
收藏/分享
文件名: OE wavefront stiching 2020.pdf
格式: Adobe PDF
文件名: OE wavefront stiching 2020.pdf
格式: Adobe PDF
所有评论 (0)
[发表评论/异议/意见]
暂无评论

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。