题名 | SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities |
作者 | |
通讯作者 | Shafie,Suhaidi |
发表日期 | 2024-08-01
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DOI | |
发表期刊 | |
ISSN | 0045-7906
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卷号 | 118 |
摘要 | This study addresses the critical gap in dynamic on-resistance characterization for GaN HEMTs within the initial unstable state in a non-isolated DC-DC converter, where the output voltage and currents fluctuate and exhibit overshoots or undershoots before stabilizing to their steady-state values, a domain within solar photovoltaic (PV) Maximum Power Point Tracking (MPPT) implementations which is crucial yet insufficiently examined. The authors present a novel multi-pulse test circuit within a synchronous buck converter configuration, complemented by SPICE simulation. This combination allows for the accurate assessment of clamping circuits' performance during transient states, significantly improving the precision of R measurements in unsteady phases. The approach deviates from conventional methods by merging empirical data with simulation insights to validate the efficacy of clamping circuits. The experimental results affirm the methodology's precision, with the highlighted Circuit V showcasing a marginal deviation of 2.32 % from existing benchmarks. This finding substantiates the method's dependability and practicality contributing to the GaN power electronics field. In addition, this research provides a powerful analytical tool for R evaluation, culminating in the design of a test PCB that synergizes with both simulated and empirical evidence, contributing future research in GaN HEMT power converter applications. |
关键词 | |
相关链接 | [Scopus记录] |
收录类别 | |
语种 | 英语
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学校署名 | 第一
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EI入藏号 | 20242616299283
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EI主题词 | Buck converter
; III-V semiconductors
; Maximum power point trackers
; Solar power generation
; SPICE
; Timing circuits
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EI分类号 | Solar Power:615.2
; Electric Components:704.1
; Electric Equipment:704.2
; Semiconducting Materials:712.1
; Electronic Circuits:713
; Pulse Circuits:713.4
; Semiconductor Devices and Integrated Circuits:714.2
; Computer Applications:723.5
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ESI学科分类 | COMPUTER SCIENCE
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Scopus记录号 | 2-s2.0-85196516144
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来源库 | Scopus
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引用统计 | |
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/778617 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.Department of Electronic and Electrical Engineering,Southern University of Science and Technology,Shenzhen,518055,China 2.Department of Electrical and Electronic Engineering,Universiti Putra Malaysia,Selangor,43400,Malaysia 3.Advanced Lightning,Power,and Energy Research (ALPER) Centre,Universiti Putra Malaysia,Selangor,43400,Malaysia 4.Institute of Nanoscience and Nanotechnology,Universiti Putra Malaysia,Selangor,43400,Malaysia 5.Institute of Nano Electronic Engineering,Universiti Malaysia Perlis,Kangar,01007,Malaysia |
第一作者单位 | 电子与电气工程系 |
第一作者的第一单位 | 电子与电气工程系 |
推荐引用方式 GB/T 7714 |
Liu,Xinzhi,Hua,Mengyuan,Shafie,Suhaidi,et al. SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities[J]. Computers and Electrical Engineering,2024,118.
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APA |
Liu,Xinzhi,Hua,Mengyuan,Shafie,Suhaidi,Radzi,Mohd Amran Mohd,&Azis,Norhafiz.(2024).SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities.Computers and Electrical Engineering,118.
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MLA |
Liu,Xinzhi,et al."SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities".Computers and Electrical Engineering 118(2024).
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