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题名

SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities

作者
通讯作者Shafie,Suhaidi
发表日期
2024-08-01
DOI
发表期刊
ISSN
0045-7906
卷号118
摘要
This study addresses the critical gap in dynamic on-resistance characterization for GaN HEMTs within the initial unstable state in a non-isolated DC-DC converter, where the output voltage and currents fluctuate and exhibit overshoots or undershoots before stabilizing to their steady-state values, a domain within solar photovoltaic (PV) Maximum Power Point Tracking (MPPT) implementations which is crucial yet insufficiently examined. The authors present a novel multi-pulse test circuit within a synchronous buck converter configuration, complemented by SPICE simulation. This combination allows for the accurate assessment of clamping circuits' performance during transient states, significantly improving the precision of R measurements in unsteady phases. The approach deviates from conventional methods by merging empirical data with simulation insights to validate the efficacy of clamping circuits. The experimental results affirm the methodology's precision, with the highlighted Circuit V showcasing a marginal deviation of 2.32 % from existing benchmarks. This finding substantiates the method's dependability and practicality contributing to the GaN power electronics field. In addition, this research provides a powerful analytical tool for R evaluation, culminating in the design of a test PCB that synergizes with both simulated and empirical evidence, contributing future research in GaN HEMT power converter applications.
关键词
相关链接[Scopus记录]
收录类别
语种
英语
学校署名
第一
EI入藏号
20242616299283
EI主题词
Buck converter ; III-V semiconductors ; Maximum power point trackers ; Solar power generation ; SPICE ; Timing circuits
EI分类号
Solar Power:615.2 ; Electric Components:704.1 ; Electric Equipment:704.2 ; Semiconducting Materials:712.1 ; Electronic Circuits:713 ; Pulse Circuits:713.4 ; Semiconductor Devices and Integrated Circuits:714.2 ; Computer Applications:723.5
ESI学科分类
COMPUTER SCIENCE
Scopus记录号
2-s2.0-85196516144
来源库
Scopus
引用统计
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/778617
专题工学院_电子与电气工程系
作者单位
1.Department of Electronic and Electrical Engineering,Southern University of Science and Technology,Shenzhen,518055,China
2.Department of Electrical and Electronic Engineering,Universiti Putra Malaysia,Selangor,43400,Malaysia
3.Advanced Lightning,Power,and Energy Research (ALPER) Centre,Universiti Putra Malaysia,Selangor,43400,Malaysia
4.Institute of Nanoscience and Nanotechnology,Universiti Putra Malaysia,Selangor,43400,Malaysia
5.Institute of Nano Electronic Engineering,Universiti Malaysia Perlis,Kangar,01007,Malaysia
第一作者单位电子与电气工程系
第一作者的第一单位电子与电气工程系
推荐引用方式
GB/T 7714
Liu,Xinzhi,Hua,Mengyuan,Shafie,Suhaidi,et al. SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities[J]. Computers and Electrical Engineering,2024,118.
APA
Liu,Xinzhi,Hua,Mengyuan,Shafie,Suhaidi,Radzi,Mohd Amran Mohd,&Azis,Norhafiz.(2024).SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities.Computers and Electrical Engineering,118.
MLA
Liu,Xinzhi,et al."SPICE Modelling-Assisted evaluation of dynamic on-resistance characterization in Schottky p-GaN HEMTs amid synchronous buck transient instabilities".Computers and Electrical Engineering 118(2024).
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