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题名

Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes

作者
通讯作者Sun, Xiao Wei
发表日期
2024-06-24
DOI
发表期刊
ISSN
0003-6951
EISSN
1077-3118
卷号124期号:26
摘要
The characteristic voltages in the capacitance-voltage (C-V) curve of quantum dot light-emitting diodes (QLEDs) are usually linked to the start of charge injection and recombination in a working device. However, it may lead to a misunderstanding of the carrier process in QLEDs. This is because capacitance change only reflects an electrical response of additional carriers induced by a small signal loaded on an applied DC voltage but does not directly correlate with the total free carrier response governed by the working voltage. In this work, we study the frequency-dependent C-V characteristics of a blue QLED, focusing on the characteristic voltages, characteristic times, and their relationships. First of all, we identify that the charge injection point of QLEDs should be extracted by the current density-voltage-luminance characteristics rather than the C-V curve. As for the characteristic voltages obtained from the C-V curve, they are determined by voltage-dependent characteristic times in different time domains. Furthermore, the C-V characteristic is helpful to evaluate charge accumulation or leakage in blue QLED, serving as an accessible analysis tool in the carrier transport process. Our work provides a definite physical meaning of characteristic voltages in the C-V curve and exhibits the usefulness of C-V characteristics for analyzing the charge dynamics of QLED.
相关链接[来源记录]
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
National Key Research and Development Program of China["2022YFB3602903","2021YFB3602703","2022YFB3606504"] ; National Natural Science Foundation of China[62122034] ; Guangdong University Key Laboratory for Advanced Quantum Dot Displays and Lighting[2017KSYS007] ; Shenzhen Key Laboratory for Advanced Quantum Dot Displays and Lighting[ZDSYS201707281632549] ; Shenzhen Science and Technology Program[JCYJ20220818100411025] ; Shenzhen Development and Reform Commission Project[XMHT20220114005]
WOS研究方向
Physics
WOS类目
Physics, Applied
WOS记录号
WOS:001259237200003
出版者
ESI学科分类
PHYSICS
来源库
Web of Science
引用统计
被引频次[WOS]:4
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/783929
专题工学院_电子与电气工程系
南方科技大学
作者单位
1.Southern Univ Sci & Technol, Inst Nanosci & Applicat, Shenzhen 518055, Peoples R China
2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
3.Southern Univ Sci & Technol, Guangdong Univ, Key Lab Energy Convers & Storage Technol, Key Lab Adv Quantum Dot Displays & Lighting,Minist, Shenzhen 518055, Peoples R China
4.Southern Univ Sci & Technol, Shenzhen Key Lab Adv Quantum Dot Displays & Lighti, Shenzhen 518055, Peoples R China
第一作者单位南方科技大学;  电子与电气工程系
通讯作者单位南方科技大学;  电子与电气工程系
第一作者的第一单位南方科技大学
推荐引用方式
GB/T 7714
Qu, Xiangwei,Ma, Jingrui,Wang, Kai,et al. Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes[J]. APPLIED PHYSICS LETTERS,2024,124(26).
APA
Qu, Xiangwei,Ma, Jingrui,Wang, Kai,&Sun, Xiao Wei.(2024).Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes.APPLIED PHYSICS LETTERS,124(26).
MLA
Qu, Xiangwei,et al."Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes".APPLIED PHYSICS LETTERS 124.26(2024).
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