题名 | Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes |
作者 | |
通讯作者 | Sun, Xiao Wei |
发表日期 | 2024-06-24
|
DOI | |
发表期刊 | |
ISSN | 0003-6951
|
EISSN | 1077-3118
|
卷号 | 124期号:26 |
摘要 | The characteristic voltages in the capacitance-voltage (C-V) curve of quantum dot light-emitting diodes (QLEDs) are usually linked to the start of charge injection and recombination in a working device. However, it may lead to a misunderstanding of the carrier process in QLEDs. This is because capacitance change only reflects an electrical response of additional carriers induced by a small signal loaded on an applied DC voltage but does not directly correlate with the total free carrier response governed by the working voltage. In this work, we study the frequency-dependent C-V characteristics of a blue QLED, focusing on the characteristic voltages, characteristic times, and their relationships. First of all, we identify that the charge injection point of QLEDs should be extracted by the current density-voltage-luminance characteristics rather than the C-V curve. As for the characteristic voltages obtained from the C-V curve, they are determined by voltage-dependent characteristic times in different time domains. Furthermore, the C-V characteristic is helpful to evaluate charge accumulation or leakage in blue QLED, serving as an accessible analysis tool in the carrier transport process. Our work provides a definite physical meaning of characteristic voltages in the C-V curve and exhibits the usefulness of C-V characteristics for analyzing the charge dynamics of QLED. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 第一
; 通讯
|
资助项目 | National Key Research and Development Program of China["2022YFB3602903","2021YFB3602703","2022YFB3606504"]
; National Natural Science Foundation of China[62122034]
; Guangdong University Key Laboratory for Advanced Quantum Dot Displays and Lighting[2017KSYS007]
; Shenzhen Key Laboratory for Advanced Quantum Dot Displays and Lighting[ZDSYS201707281632549]
; Shenzhen Science and Technology Program[JCYJ20220818100411025]
; Shenzhen Development and Reform Commission Project[XMHT20220114005]
|
WOS研究方向 | Physics
|
WOS类目 | Physics, Applied
|
WOS记录号 | WOS:001259237200003
|
出版者 | |
ESI学科分类 | PHYSICS
|
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:4
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/783929 |
专题 | 工学院_电子与电气工程系 南方科技大学 |
作者单位 | 1.Southern Univ Sci & Technol, Inst Nanosci & Applicat, Shenzhen 518055, Peoples R China 2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China 3.Southern Univ Sci & Technol, Guangdong Univ, Key Lab Energy Convers & Storage Technol, Key Lab Adv Quantum Dot Displays & Lighting,Minist, Shenzhen 518055, Peoples R China 4.Southern Univ Sci & Technol, Shenzhen Key Lab Adv Quantum Dot Displays & Lighti, Shenzhen 518055, Peoples R China |
第一作者单位 | 南方科技大学; 电子与电气工程系 |
通讯作者单位 | 南方科技大学; 电子与电气工程系 |
第一作者的第一单位 | 南方科技大学 |
推荐引用方式 GB/T 7714 |
Qu, Xiangwei,Ma, Jingrui,Wang, Kai,et al. Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes[J]. APPLIED PHYSICS LETTERS,2024,124(26).
|
APA |
Qu, Xiangwei,Ma, Jingrui,Wang, Kai,&Sun, Xiao Wei.(2024).Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes.APPLIED PHYSICS LETTERS,124(26).
|
MLA |
Qu, Xiangwei,et al."Characteristic voltages and times from capacitance-voltage analysis of quantum dot light-emitting diodes".APPLIED PHYSICS LETTERS 124.26(2024).
|
条目包含的文件 | 条目无相关文件。 |
|
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论