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题名

Sub-5 nm Ultrathin In2O3 Transistors for High-Performance and Low-Power Electronic Applications

作者
通讯作者Ang, Yee Sin; Quhe, Ruge; Lu, Jing
发表日期
2024-04-27
DOI
发表期刊
ISSN
1944-8244
EISSN
1944-8252
卷号16期号:18
摘要
Ultrathin oxide semiconductors are promising candidates for back-end-of-line (BEOL) compatible transistors and monolithic three-dimensional integration. Experimentally, ultrathin indium oxide (In2O3) field-effect transistors (FETs) with thicknesses down to 0.4 nm exhibit an extremely high drain current (10(4) mu A/mu m) and transconductance (4000 mu S/mu m). Here, we employ ab initio quantum transport simulation to investigate the performance limit of sub-5 nm gate length (L-g) ultrathin In2O3 FETs. Based on the International Technology Roadmap for Semiconductors (ITRS) criteria for high-performance (HP) devices, the scaling limit of ultrathin In2O3 FETs can reach 2 nm in terms of on-state current, delay time, and power dissipation. The wide bandgap nature of ultrathin In2O3 (3.0 eV) renders it a suitable candidate for ITRS low-power (LP) electronics with L-g down to 3 nm. Notably, both the HP and LP ultrathin In2O3 FETs exhibit superior energy-delay products as compared to those of other common 2D semiconductors such as monolayer MoS2 and MoTe2. These findings unveil the potential of ultrathin In2O3 in HP and LP nanoelectronic device applications.
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收录类别
SCI ; EI
语种
英语
学校署名
其他
资助项目
Ministry of Science and Technology of China["2022YFA1203904","2022YFA1200072"] ; National Natural Science Foundation of China["62174074","91964101","12274002","12164036"] ; Natural Science Foundation of Ningxia of China[2020AAC03271] ; Shenzhen Fundamental Research Program[JCYJ20220530115014032] ; Zhujiang Young Talent Program[2021QN02X362] ; Guangdong Provincial Department of Education Innovation Team Program["2021KCXTD012","22-SIS-SMU-054"] ; SUTD-ZJU Thematic Research Grant (SUTD-ZJU (TR))[202203]
WOS研究方向
Science & Technology - Other Topics ; Materials Science
WOS类目
Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary
WOS记录号
WOS:001242041400001
出版者
来源库
Web of Science
引用统计
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/788099
专题工学院_深港微电子学院
作者单位
1.Peking Univ, State Key Lab Mesoscop Phys, Beijing 100871, Peoples R China
2.Peking Univ, Dept Phys, Beijing 100871, Peoples R China
3.Singapore Univ Technol & Design SUTD, Sci Math & Technol, Singapore 487372, Singapore
4.Ningxia Normal Univ, Engn Res Ctr Nanostruct & Funct Mat, Sch Phys & Elect Informat Engn, Guyuan 756000, Peoples R China
5.Southern Univ Sci & Technol, Sch Microelect, Shenzhen 518055, Peoples R China
6.Zhejiang Univ, Coll Informat Sci & Elect Engn, Hangzhou 310027, Peoples R China
7.Zhejiang Univ, Zhejiang Univ Univ Illinois Urbana Champaign Inst, Haining 314400, Peoples R China
8.Shaanxi Univ Technol, Sch Phys & Telecommun Engn, Shaanxi Key Lab Catalysis, Hanzhong 723001, Peoples R China
9.Beijing Univ Posts & Telecommun, State Key Lab Informat Photon & Opt Commun, Beijing 100876, Peoples R China
10.Beijing Univ Posts & Telecommun, Sch Sci, Beijing 100876, Peoples R China
11.Collaborat Innovat Ctr Quantum Matter, Beijing 100871, Peoples R China
12.Beijing Key Lab Magnetoelect Mat & Devices, Beijing 100871, Peoples R China
13.Peking Univ, Yangtze Delta Inst Optoelect, Nantong 226000, Peoples R China
14.Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
推荐引用方式
GB/T 7714
Xu, Linqiang,Xu, Lianqiang,Lan, Jun,et al. Sub-5 nm Ultrathin In2O3 Transistors for High-Performance and Low-Power Electronic Applications[J]. ACS APPLIED MATERIALS & INTERFACES,2024,16(18).
APA
Xu, Linqiang.,Xu, Lianqiang.,Lan, Jun.,Li, Yida.,Li, Qiuhui.,...&Lu, Jing.(2024).Sub-5 nm Ultrathin In2O3 Transistors for High-Performance and Low-Power Electronic Applications.ACS APPLIED MATERIALS & INTERFACES,16(18).
MLA
Xu, Linqiang,et al."Sub-5 nm Ultrathin In2O3 Transistors for High-Performance and Low-Power Electronic Applications".ACS APPLIED MATERIALS & INTERFACES 16.18(2024).
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