题名 | Superionic fluoride gate dielectrics with low diffusion barrier for two-dimensional electronics |
作者 | |
通讯作者 | Yang, Yurong; Xue, Qi-Kun; Cui, Yi; Yuan, Hongtao |
发表日期 | 2024-05-01
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DOI | |
发表期刊 | |
ISSN | 1748-3387
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EISSN | 1748-3395
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卷号 | 19页码:932-940 |
摘要 | Exploration of new dielectrics with a large capacitive coupling is an essential topic in modern electronics when conventional dielectrics suffer from the leakage issue near the breakdown limit. Here, to address this looming challenge, we demonstrate that rare-earth metal fluorides with extremely low ion migration barriers can generally exhibit an excellent capacitive coupling over 20 mu F cm(-2) (with an equivalent oxide thickness of similar to 0.15 nm and a large effective dielectric constant near 30) and great compatibility with scalable device manufacturing processes. Such a static dielectric capability of superionic fluorides is exemplified by MoS2 transistors exhibiting high on/off current ratios over 10(8), ultralow subthreshold swing of 65 mV dec(-1) and ultralow leakage current density of similar to 10(-6) A cm(-2). Therefore, the fluoride-gated logic inverters can achieve notably higher static voltage gain values (surpassing similar to 167) compared with a conventional dielectric. Furthermore, the application of fluoride gating enables the demonstration of NAND, NOR, AND and OR logic circuits with low static energy consumption. In particular, the superconductor-insulator transition at the clean-limit Bi2Sr2CaCu2O8+delta can also be realized through fluoride gating. Our findings highlight fluoride dielectrics as a pioneering platform for advanced electronic applications and for tailoring emergent electronic states in condensed matter. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 通讯
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资助项目 | National Natural Science Foundation of China (National Science Foundation of China)["92365203","52072168"]
; National Natural Science Foundation of China[2021YFA1202901]
; US Department of Energy, Office of Basic Energy Sciences[DE-AC02-76SF00515]
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WOS研究方向 | Science & Technology - Other Topics
; Materials Science
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WOS类目 | Nanoscience & Nanotechnology
; Materials Science, Multidisciplinary
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WOS记录号 | WOS:001223853900002
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出版者 | |
EI入藏号 | 20242016101603
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EI主题词 | Calcium compounds
; Computer circuits
; Copper compounds
; Dielectric materials
; Diffusion barriers
; Energy utilization
; Gate dielectrics
; Layered semiconductors
; Molybdenum compounds
; Rare earths
; Strontium compounds
; Transition metals
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EI分类号 | Energy Utilization:525.3
; Metallurgy and Metallography:531
; Dielectric Materials:708.1
; Semiconducting Materials:712.1
; Semiconductor Devices and Integrated Circuits:714.2
; Computer Circuits:721.3
; Inorganic Compounds:804.2
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来源库 | Web of Science
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引用统计 |
被引频次[WOS]:3
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/788451 |
专题 | 理学院_物理系 |
作者单位 | 1.Nanjing Univ, Coll Engn & Appl Sci, Jiangsu Key Lab Artificial Funct Mat, Natl Lab Solid State Microstruct, Nanjing, Peoples R China 2.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing, Peoples R China 3.Tsinghua Univ, State Key Lab Low Dimens Quantum Phys, Beijing, Peoples R China 4.Tsinghua Univ, Dept Phys, Beijing, Peoples R China 5.Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY USA 6.SLAC Natl Accelerator Lab, Stanford Inst Mat & Energy Sci, Menlo Pk, CA 94025 USA 7.Stanford Univ, Geballe Lab Adv Mat, Stanford, CA 94305 USA 8.Stanford Univ, Dept Appl Phys, Stanford, CA USA 9.Southern Univ Sci & Technol, Dept Phys, Shenzhen, Peoples R China 10.Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA |
通讯作者单位 | 物理系 |
推荐引用方式 GB/T 7714 |
Meng, Kui,Li, Zeya,Chen, Peng,et al. Superionic fluoride gate dielectrics with low diffusion barrier for two-dimensional electronics[J]. NATURE NANOTECHNOLOGY,2024,19:932-940.
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APA |
Meng, Kui.,Li, Zeya.,Chen, Peng.,Ma, Xingyue.,Huang, Junwei.,...&Yuan, Hongtao.(2024).Superionic fluoride gate dielectrics with low diffusion barrier for two-dimensional electronics.NATURE NANOTECHNOLOGY,19,932-940.
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MLA |
Meng, Kui,et al."Superionic fluoride gate dielectrics with low diffusion barrier for two-dimensional electronics".NATURE NANOTECHNOLOGY 19(2024):932-940.
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条目包含的文件 | 条目无相关文件。 |
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