Increased Deep Trap Density in Interfacial Engineered Nanocomposite Revealed by Sequential Kelvin Probe Force Microscopy for High Dielectric Energy Storage

Liu, Kaixin1,2; Zhang, Fengyuan1,2; Liu, Zhigang1,2; Song, Chunlin1,2; Zhang, Lingyu3; Ming, Wenjie1,2; Yang, Lingyu4; Wang, Yao3; Huang, Boyuan1,2; Li, Jiangyu1,2

2024-05-01

10.1002/smtd.202301755

SMALL METHODS   影响因子和分区

2366-9608

["Nanocomposites combining inorganic nanoparticles with high dielectric constant and polymers with high breakdown strength are promising for the high energy density storage of electricity, and carrier traps can significantly affect the dielectric breakdown process. Nevertheless, there still lacks direct experimental evidence on how nanoparticles affect the trap characteristics of nanocomposites, especially in a spatially resolved manner. Here, a technique is developed to image the trap distribution based on sequential Kelvin probe force microscopy (KPFM) in combination with the isothermal surface potential decay (ISPD) technique, wherein both shallow and deep trap densities and the corresponding energy levels can be mapped with nanoscale resolution. The technique is first validated using the widely-used commercial biaxially oriented polypropylene, yielding consistent results with macroscopic ISPD. The technique is then applied to investigate polyvinylidene fluoride-based nanocomposites filled with barium titanate nanoparticles, revealing higher deep trap density around surface-modified nanoparticles, which correlates well with its increased breakdown strength. This technique thus provides a powerful spatially resolved tool for understanding the microscopic mechanism of dielectric breakdown of nanocomposites.","A nanoscale isothermal surface potential decay (ISPD) technique is developed based on sequential Kelvin probe force microscopy (KPFM) to map the carrier trap distribution, revealing higher deep trap density around surface modified nanoparticles in composite dielectrics, which explains its increased breakdown strength. image"]

carrier trap dielectric breakdown ISPD KPFM nanocomposite dielectrics

SCI ; EI

英语

第一 ; 通讯

National Natural Science Foundation of China["92066203","92366302","52303296","12192213","12302199"] ; Guangdong Provincial Key Laboratory Program from Guangdong Science and Technology Department[2021B1212040001] ; Shenzhen Science and Technology Program[JCYJ20220818100410022] ; Guangdong Provincial Department of Education Innovation Team Program[2021KCXTD012] ; Guangdong Basic and Applied Basic Research Foundation[2021A1515110155] ; null[2022YFF0706100]

Chemistry ; Science & Technology - Other Topics ; Materials Science

Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary

WOS:001215421100001

WILEY-V C H VERLAG GMBH

Web of Science

1.Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Peoples R China
2.Southern Univ Sci & Technol, Guangdong Prov Key Lab Funct Oxide Mat & Devices, Shenzhen 518055, Peoples R China
3.Beihang Univ, Sch Mat Sci & Engn, Beijing 100191, Peoples R China
4.Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China

Liu, Kaixin,Zhang, Fengyuan,Liu, Zhigang,et al. Increased Deep Trap Density in Interfacial Engineered Nanocomposite Revealed by Sequential Kelvin Probe Force Microscopy for High Dielectric Energy Storage[J]. SMALL METHODS,2024.

Liu, Kaixin.,Zhang, Fengyuan.,Liu, Zhigang.,Song, Chunlin.,Zhang, Lingyu.,...&Li, Jiangyu.(2024).Increased Deep Trap Density in Interfacial Engineered Nanocomposite Revealed by Sequential Kelvin Probe Force Microscopy for High Dielectric Energy Storage.SMALL METHODS.

Liu, Kaixin,et al."Increased Deep Trap Density in Interfacial Engineered Nanocomposite Revealed by Sequential Kelvin Probe Force Microscopy for High Dielectric Energy Storage".SMALL METHODS (2024).