Rotational position error correction in ptychography

Lin, Angyi1; Sheng, Pengju1; Ning, Shoucong2; Zhang, Fucai1

2024-01-20

10.1364/AO.510143

APPLIED OPTICS   影响因子和分区

1559-128X

2155-3165

Accurate determination of scan positions is essential for achieving high -quality reconstructions in ptychographic imaging. This study presents and demonstrates a method for determining the rotation angle of the scan pattern relative to the detector pixel array using diffraction data. The method is based on the Fourier-Mellin transform and cross -correlation calculation. It can correct rotation errors up to 60 deg. High -quality reconstructions were obtained for visible light and electron microscopy datasets, and intricate structures of samples can be revealed. We believe that this refinement method for rotary position errors can be valuable for improving the performance of ptychographic four-dimensional scanning transmission electron microscopy. (c) 2024 Optica Publishing Group

SCI ; EI

英语

第一 ; 通讯

National Natural Science Foundation of China["12074167","11775105"] ; Shenzhen Science and Technology Program[KQTD20170810110313773] ; Centers for Mechanical Engineering Research and Education at MIT and SUSTech[6941806]

Optics

Optics

WOS:001214668000002

Optica Publishing Group

PHYSICS

Web of Science

1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
2.Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117575, Singapore

Lin, Angyi,Sheng, Pengju,Ning, Shoucong,et al. Rotational position error correction in ptychography[J]. APPLIED OPTICS,2024,63(3).

Lin, Angyi,Sheng, Pengju,Ning, Shoucong,&Zhang, Fucai.(2024).Rotational position error correction in ptychography.APPLIED OPTICS,63(3).

Lin, Angyi,et al."Rotational position error correction in ptychography".APPLIED OPTICS 63.3(2024).