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题名

Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles

作者
通讯作者Cao, Jiahe; Tan, Chee-Keong
发表日期
2024-02-01
DOI
发表期刊
ISSN
2050-7526
EISSN
2050-7534
卷号12期号:5
摘要
First-principles calculations were employed to determine the surface energy and fracture toughness of monoclinic Ga2O3 and (InxGa1-x)(2)O-3 alloy with In content up to 37.5%. The lattice parameters and elastic constants of (InxGa1-x)(2)O-3 alloys are calculated and followed Vegard's law with an increasing In concentration. The most probable crack planes for each growth orientation, [100], [010] and [001], are determined through comparison with the surface energy and fracture toughness of monoclinic Ga2O3. In addition, the critical thicknesses of the (InxGa1-x)(2)O-3 epitaxial film grown on the Ga2O3 substrate in [100], [010] and [001] orientations were found to be 40 nm, 35 nm and 36 nm, respectively at an In content up to 37.5%, suggesting reasonable pseudomorphic growth conditions for (InxGa1-x)(2)O-3/Ga2O3 heterostructure formation. Based on the analysis of bond lengths, dangling bonds and surface coordination, the stability of the surface in the (100) direction with surface terminations including Ga and O atoms was found to have lower fracture toughness than the other surfaces, implying that epitaxial growth with the (100) crack surface might result in lower defects with a higher film thickness. Overall, the cracking mechanisms in the (InxGa1-x)(2)O-3 film grown on the Ga2O3 substrate with different orientations are elucidated.
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语种
英语
学校署名
其他
资助项目
Guangzhou Municipal Science and Technology Project[QN2022030022L] ; C. K. Tan start-up fund from the Hong Kong University of Science and Technology (Guangzhou), State Administration of Foreign Experts Affairs China["2023A03J0003","2023A03J0013","2023A04J0310"]
WOS研究方向
Materials Science ; Physics
WOS类目
Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号
WOS:001142891200001
出版者
来源库
Web of Science
引用统计
被引频次[WOS]:2
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/789383
专题工学院_机械与能源工程系
作者单位
1.Hong Kong Univ Sci & Technol Guangzhou, Adv Mat Thrust, Funct Hub, Guangzhou 511466, Nansha, Peoples R China
2.Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Peoples R China
3.Nanjing Univ Posts & Telecommun, Coll Integrated Circuit Sci & Engn, Innovat Ctr Gallium Oxide Semicond IC GAO, Nanjing 210023, Peoples R China
4.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
5.Hong Kong Univ Sci & Technol Guangzhou, Guangzhou Municipal Key Lab Mat Informat, Guangzhou 511400, Guangdong, Peoples R China
6.Hong Kong Univ Sci & Technol Guangzhou, Guangzhou Municipal Key Lab Integrated Circuits De, Guangzhou 511453, Guangdong, Peoples R China
推荐引用方式
GB/T 7714
Cao, Jiahe,Xie, Zhigao,Wang, Yan,et al. Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles[J]. JOURNAL OF MATERIALS CHEMISTRY C,2024,12(5).
APA
Cao, Jiahe.,Xie, Zhigao.,Wang, Yan.,Song, Hanzhao.,Zeng, Guosong.,...&Tan, Chee-Keong.(2024).Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles.JOURNAL OF MATERIALS CHEMISTRY C,12(5).
MLA
Cao, Jiahe,et al."Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles".JOURNAL OF MATERIALS CHEMISTRY C 12.5(2024).
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