题名 | Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles |
作者 | |
通讯作者 | Cao, Jiahe; Tan, Chee-Keong |
发表日期 | 2024-02-01
|
DOI | |
发表期刊 | |
ISSN | 2050-7526
|
EISSN | 2050-7534
|
卷号 | 12期号:5 |
摘要 | First-principles calculations were employed to determine the surface energy and fracture toughness of monoclinic Ga2O3 and (InxGa1-x)(2)O-3 alloy with In content up to 37.5%. The lattice parameters and elastic constants of (InxGa1-x)(2)O-3 alloys are calculated and followed Vegard's law with an increasing In concentration. The most probable crack planes for each growth orientation, [100], [010] and [001], are determined through comparison with the surface energy and fracture toughness of monoclinic Ga2O3. In addition, the critical thicknesses of the (InxGa1-x)(2)O-3 epitaxial film grown on the Ga2O3 substrate in [100], [010] and [001] orientations were found to be 40 nm, 35 nm and 36 nm, respectively at an In content up to 37.5%, suggesting reasonable pseudomorphic growth conditions for (InxGa1-x)(2)O-3/Ga2O3 heterostructure formation. Based on the analysis of bond lengths, dangling bonds and surface coordination, the stability of the surface in the (100) direction with surface terminations including Ga and O atoms was found to have lower fracture toughness than the other surfaces, implying that epitaxial growth with the (100) crack surface might result in lower defects with a higher film thickness. Overall, the cracking mechanisms in the (InxGa1-x)(2)O-3 film grown on the Ga2O3 substrate with different orientations are elucidated. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 其他
|
资助项目 | Guangzhou Municipal Science and Technology Project[QN2022030022L]
; C. K. Tan start-up fund from the Hong Kong University of Science and Technology (Guangzhou), State Administration of Foreign Experts Affairs China["2023A03J0003","2023A03J0013","2023A04J0310"]
|
WOS研究方向 | Materials Science
; Physics
|
WOS类目 | Materials Science, Multidisciplinary
; Physics, Applied
|
WOS记录号 | WOS:001142891200001
|
出版者 | |
来源库 | Web of Science
|
引用统计 |
被引频次[WOS]:2
|
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/789383 |
专题 | 工学院_机械与能源工程系 |
作者单位 | 1.Hong Kong Univ Sci & Technol Guangzhou, Adv Mat Thrust, Funct Hub, Guangzhou 511466, Nansha, Peoples R China 2.Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Peoples R China 3.Nanjing Univ Posts & Telecommun, Coll Integrated Circuit Sci & Engn, Innovat Ctr Gallium Oxide Semicond IC GAO, Nanjing 210023, Peoples R China 4.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China 5.Hong Kong Univ Sci & Technol Guangzhou, Guangzhou Municipal Key Lab Mat Informat, Guangzhou 511400, Guangdong, Peoples R China 6.Hong Kong Univ Sci & Technol Guangzhou, Guangzhou Municipal Key Lab Integrated Circuits De, Guangzhou 511453, Guangdong, Peoples R China |
推荐引用方式 GB/T 7714 |
Cao, Jiahe,Xie, Zhigao,Wang, Yan,et al. Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles[J]. JOURNAL OF MATERIALS CHEMISTRY C,2024,12(5).
|
APA |
Cao, Jiahe.,Xie, Zhigao.,Wang, Yan.,Song, Hanzhao.,Zeng, Guosong.,...&Tan, Chee-Keong.(2024).Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles.JOURNAL OF MATERIALS CHEMISTRY C,12(5).
|
MLA |
Cao, Jiahe,et al."Fracture toughness and critical thickness of β-(InxGa1-x)2O3/Ga2O3 by first principles".JOURNAL OF MATERIALS CHEMISTRY C 12.5(2024).
|
条目包含的文件 | 条目无相关文件。 |
|
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论