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题名

Ultra-low-defect homoepitaxial micro-LEDs with enhanced efficiency and monochromaticity for high-PPI AR/MR displays

作者
通讯作者Liu, Zhaojun
发表日期
2024-08-14
DOI
发表期刊
EISSN
2662-1991
卷号5期号:1
摘要
The issue of brightness in strong ambient light conditions is one of the critical obstacles restricting the application of augmented reality (AR) and mixed reality (MR). Gallium nitride (GaN)-based micro-LEDs, renowned for their exceptional brightness and stability, are considered the foremost contenders for AR applications. Nevertheless, conventional heteroepitaxial growth micro-LED devices confront formidable challenges, including substantial wavelength shifts and efficiency droop. In this paper, we firstly demonstrated the high-quality homoepitaxial GaN-on-GaN micro-LEDs micro-display, and thoroughly analyzed the possible benefits for free-standing GaN substrate from the material-level characterization to device optoelectronic properties and micro-display application compared with sapphire substrate. The GaN-on-GaN structure exhibits a superior crystal quality with ultra-low threading dislocation densities (TDDs) of similar to 10(5) cm(-2), which is three orders of magnitude lower than that of GaN-on-Sapphire. Through an in-depth size-dependent optoelectronic analysis of blue/green emission GaN-on-GaN/ Sapphire micro-LEDs from 100 x 100 shrink to 3 x 3 mu m(2), real that a lower forward voltage and series resistance, a consistent emission wavelength (1.21 nm for blue and 4.79 nm for green @ 500 A/cm(2)), coupled with a notable reduction in efficiency droop ratios (15.6% for blue and 28.5% for green @ 500 A/cm(2)) and expanded color gamut (103.57% over Rec. 2020) within GaN-on-GaN 10 mu m micro-LEDs. Last but not least, the GaN-on-GaN micro-display with 3000 pixels per inch (PPI) showcased enhanced display uniformity and higher luminance in comparison to its GaN-on-Sapphire counterpart, demonstrating significant potentials for high-brightness AR/MR applications under strong ambient light.
相关链接[来源记录]
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语种
英语
学校署名
通讯
WOS研究方向
Optics
WOS类目
Optics
WOS记录号
WOS:001291668800001
出版者
来源库
Web of Science
引用统计
被引频次[WOS]:1
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/804702
专题工学院_电子与电气工程系
作者单位
1.Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Peoples R China
2.Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen, Peoples R China
3.Chinese Acad Sci, Suzhou Inst Nanotech & Nanob, Jiangsu Inst Adv Semicond, Suzhou, Peoples R China
通讯作者单位电子与电气工程系
推荐引用方式
GB/T 7714
Liu, Yibo,Wang, Guobin,Feng, Feng,et al. Ultra-low-defect homoepitaxial micro-LEDs with enhanced efficiency and monochromaticity for high-PPI AR/MR displays[J]. PHOTONIX,2024,5(1).
APA
Liu, Yibo.,Wang, Guobin.,Feng, Feng.,Zhanghu, Mengyuan.,Yuan, Zhengnan.,...&Liu, Zhaojun.(2024).Ultra-low-defect homoepitaxial micro-LEDs with enhanced efficiency and monochromaticity for high-PPI AR/MR displays.PHOTONIX,5(1).
MLA
Liu, Yibo,et al."Ultra-low-defect homoepitaxial micro-LEDs with enhanced efficiency and monochromaticity for high-PPI AR/MR displays".PHOTONIX 5.1(2024).
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