中文版 | English
题名

Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science

作者
通讯作者Lin, Jun-Hao
发表日期
2024-07-01
DOI
发表期刊
ISSN
1674-1056
EISSN
2058-3834
卷号33
摘要
Transmission electron microscopy (TEM) offers unparalleled atomic-resolution imaging of complex materials and heterogeneous structures. However, high-energy imaging electrons can induce structural damage, posing a challenge for electron-beam-sensitive materials. Cryogenic TEM (Cryo-TEM) has revolutionized structural biology, enabling the visualization of biomolecules in their near-native states at unprecedented detail. The low electron dose imaging and stable cryogenic environment in Cryo-TEM are now being harnessed for the investigation of electron-beam-sensitive materials and low-temperature quantum phenomena. Here, we present a systematic review of the interaction mechanisms between imaging electrons and atomic structures, illustrating the electron beam-induced damage and the mitigating role of Cryo-TEM. This review then explores the advancements in low-dose Cryo-TEM imaging for elucidating the structures of organic-based materials. Furthermore, we showcase the application of Cryo-TEM in the study of strongly correlated quantum materials, including the detection of charge order and novel topological spin textures. Finally, we discuss the future prospects of Cryo-TEM, emphasizing its transformative potential in unraveling the complexities of materials and phenomena across diverse scientific disciplines.
© 2024 Chinese Physical Society and IOP Publishing Ltd.
收录类别
SCI ; EI
语种
英语
学校署名
第一 ; 通讯
资助项目
Project supported by the National Natural Science Foundation of China (Grant No. 11974156), the Guangdong Innovative and Entrepreneurial Research Team Program (Grant No. 2019ZT08C044), the Shenzhen Science and Technology Program (Grant Nos. KQTD20190929173815000 and 20200925161102001), and the Science, Technology and Innovation Commission of Shenzhen Municipality (Grant No. ZDSYS20190902092905285).
出版者
EI入藏号
20243216811779
EI主题词
Electron beams ; Electrons ; High resolution transmission electron microscopy ; Temperature ; Textures ; Transmissions
EI分类号
Mechanical Transmissions:602.2 ; Thermodynamics:641.1 ; Cryogenics:644.4 ; Optical Devices and Systems:741.3
来源库
EV Compendex
引用统计
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/807046
专题理学院_物理系
南方科技大学
作者单位
1.Department of Physics, Shenzhen Key Laboratory of Advanced Quantum Functional Materials and Devices, Southern University of Science and Technology, Shenzhen; 518055, China
2.Quantum Science Center of Guangdong-Hong Kong-Macao Greater Bay Area (Guangdong), Shenzhen; 518045, China
第一作者单位物理系
通讯作者单位物理系
第一作者的第一单位物理系
推荐引用方式
GB/T 7714
Wang, Gang,Lin, Jun-Hao. Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science[J]. Chinese Physics B,2024,33.
APA
Wang, Gang,&Lin, Jun-Hao.(2024).Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science.Chinese Physics B,33.
MLA
Wang, Gang,et al."Cryogenic transmission electron microscopy on beam-sensitive materials and quantum science".Chinese Physics B 33(2024).
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