题名 | All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors |
作者 | |
发表日期 | 2024
|
DOI | |
发表期刊 | |
ISSN | 0741-3106
|
EISSN | 1558-0563
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卷号 | PP期号:99页码:1-1 |
摘要 | Herein, In2O3/Al2O3/Y6 transistors exhibiting bidirectional photoresponse (BPR) characteristic were fabricated. By utilizing this feature, XOR optoelectronic logic gate was successfully designed and applied in near-infrared (NIR) image encryption. Furthermore, an identity verification was proposed by binary encoding the current from different NIR and ultraviolet (UV) illumination combinations. Finally, a photoelectric watermark scheme responsive to UV light was proposed leveraging NIR’s non-volatile programming. The integration of a secure sensor strategy that encompasses image encryption, identity verification, and photoelectric watermark addresses the need for enhanced data protection and offering a comprehensive security solution for the Internet of Things (IoT). IEEE |
相关链接 | [IEEE记录] |
收录类别 | |
语种 | 英语
|
学校署名 | 其他
|
出版者 | |
EI入藏号 | 20243516931493
|
EI主题词 | Authentication
; Error correction
; Gates (transistor)
; Model checking
; Phase locked loops
; Photoelectric devices
; Signal encoding
; Watermarking
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EI分类号 | :1102.1
; :1108.1
; :209.1.1
; Electronic Circuits Other Than Amplifiers, Oscillators, Modulators, Limiters, Discriminators or Mixers:713.5
; Semiconductor Devices and Integrated Circuits:714.2
; Information Theory and Signal Processing:716.1
; :731.1.1
; Optical Devices and Systems:741.3
|
ESI学科分类 | ENGINEERING
|
来源库 | EV Compendex
|
引用统计 | |
成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/807135 |
专题 | 工学院_电子与电气工程系 |
作者单位 | 1.School of Microelectronics, State Key Laboratory of Wide Band Gap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China 2.School of Engineering, Key Laboratory of 3D Micro/Nano Fabrication and Characterization of Zhejiang Province, Westlake University, Hangzhou, China 3.Department of Electronic and Electronical Engineering, Southern University of Science and Technology, Shenzhen, China |
推荐引用方式 GB/T 7714 |
Zeng, Tonglong,Li, Dingwei,Wang, Rui,et al. All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors[J]. IEEE Electron Device Letters,2024,PP(99):1-1.
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APA |
Zeng, Tonglong.,Li, Dingwei.,Wang, Rui.,Jing, Xiaotao.,Zhang, Wanlin.,...&Hao, Yue.(2024).All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors.IEEE Electron Device Letters,PP(99),1-1.
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MLA |
Zeng, Tonglong,et al."All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors".IEEE Electron Device Letters PP.99(2024):1-1.
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条目包含的文件 | 条目无相关文件。 |
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