中文版 | English
题名

All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors

作者
发表日期
2024
DOI
发表期刊
ISSN
0741-3106
EISSN
1558-0563
卷号PP期号:99页码:1-1
摘要
Herein, In2O3/Al2O3/Y6 transistors exhibiting bidirectional photoresponse (BPR) characteristic were fabricated. By utilizing this feature, XOR optoelectronic logic gate was successfully designed and applied in near-infrared (NIR) image encryption. Furthermore, an identity verification was proposed by binary encoding the current from different NIR and ultraviolet (UV) illumination combinations. Finally, a photoelectric watermark scheme responsive to UV light was proposed leveraging NIR’s non-volatile programming. The integration of a secure sensor strategy that encompasses image encryption, identity verification, and photoelectric watermark addresses the need for enhanced data protection and offering a comprehensive security solution for the Internet of Things (IoT).
IEEE
相关链接[IEEE记录]
收录类别
语种
英语
学校署名
其他
出版者
EI入藏号
20243516931493
EI主题词
Authentication ; Error correction ; Gates (transistor) ; Model checking ; Phase locked loops ; Photoelectric devices ; Signal encoding ; Watermarking
EI分类号
:1102.1 ; :1108.1 ; :209.1.1 ; Electronic Circuits Other Than Amplifiers, Oscillators, Modulators, Limiters, Discriminators or Mixers:713.5 ; Semiconductor Devices and Integrated Circuits:714.2 ; Information Theory and Signal Processing:716.1 ; :731.1.1 ; Optical Devices and Systems:741.3
ESI学科分类
ENGINEERING
来源库
EV Compendex
引用统计
成果类型期刊论文
条目标识符http://sustech.caswiz.com/handle/2SGJ60CL/807135
专题工学院_电子与电气工程系
作者单位
1.School of Microelectronics, State Key Laboratory of Wide Band Gap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China
2.School of Engineering, Key Laboratory of 3D Micro/Nano Fabrication and Characterization of Zhejiang Province, Westlake University, Hangzhou, China
3.Department of Electronic and Electronical Engineering, Southern University of Science and Technology, Shenzhen, China
推荐引用方式
GB/T 7714
Zeng, Tonglong,Li, Dingwei,Wang, Rui,et al. All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors[J]. IEEE Electron Device Letters,2024,PP(99):1-1.
APA
Zeng, Tonglong.,Li, Dingwei.,Wang, Rui.,Jing, Xiaotao.,Zhang, Wanlin.,...&Hao, Yue.(2024).All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors.IEEE Electron Device Letters,PP(99),1-1.
MLA
Zeng, Tonglong,et al."All-in-one of Image Encryption, Identity Verification and Photoelectric Watermark based on Bidirectionally Photoresponsive Transistors".IEEE Electron Device Letters PP.99(2024):1-1.
条目包含的文件
条目无相关文件。
个性服务
原文链接
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
导出为Excel格式
导出为Csv格式
Altmetrics Score
谷歌学术
谷歌学术中相似的文章
[Zeng, Tonglong]的文章
[Li, Dingwei]的文章
[Wang, Rui]的文章
百度学术
百度学术中相似的文章
[Zeng, Tonglong]的文章
[Li, Dingwei]的文章
[Wang, Rui]的文章
必应学术
必应学术中相似的文章
[Zeng, Tonglong]的文章
[Li, Dingwei]的文章
[Wang, Rui]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
[发表评论/异议/意见]
暂无评论

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。