南方科技大学知识苑(SUSTech KC): Aging Behavior of Quantum Dot Light-Emitting Diodes Employing Sputtered TiO<inf>2</inf> as the Electron Transport Layer

题名	Aging Behavior of Quantum Dot Light-Emitting Diodes Employing Sputtered TiO2 as the Electron Transport Layer
作者	Pan, Xinyi 1,2; Wei, Jiahao 1,2; Li, Depeng1,2 ; Xu, Zhonghua 1,3; Ma, Jingrui1,2 ; Wei Sun, Xiao 1,2
通讯作者	Ma, Jingrui; Wei Sun, Xiao
DOI	10.1002/sdtp.17369
发表日期	2024
会议名称	International Conference on Display Technology, 2024
ISSN	0097-966X
EISSN	2168-0159
会议录名称	Digest of Technical Papers - SID International Symposium
卷号	55
页码	1367
会议日期	March 31, 2024 - April 3, 2024
会议地点	Hefei, China
出版者	John Wiley and Sons Inc
学校署名	第一 ; 通讯
语种	英语
收录类别	EI
EI入藏号	20243216809975
来源库	EV Compendex
引用统计
成果类型	会议论文
条目标识符	http://sustech.caswiz.com/handle/2SGJ60CL/807146
专题	工学院_电子与电气工程系南方科技大学
作者单位	1.Institute of Nanoscience and Applications, Southern University of Science and Technology, Shenzhen; 518055, China 2.Key Laboratory of Energy Conversion and Storage Technologies (Southern University of Science and Technology), Ministry of Education, Guangdong-Hong Kong-Macao Joint Laboratory for Photonic-Thermal-Electrical Energy Materials and Devices, and Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen; 518055, China 3.College of Mathematics, Physics and Electronic Information Engineering, Guangxi Minzu Normal University, Chongzuo; 532200, China
第一作者单位	南方科技大学; 电子与电气工程系
通讯作者单位	南方科技大学; 电子与电气工程系
第一作者的第一单位	南方科技大学
推荐引用方式 GB/T 7714	Pan, Xinyi,Wei, Jiahao,Li, Depeng,et al. Aging Behavior of Quantum Dot Light-Emitting Diodes Employing Sputtered TiO2 as the Electron Transport Layer[C]:John Wiley and Sons Inc,2024:1367.