题名 | Magnesium niobate as a high-κ gate dielectric for two-dimensional electronics |
作者 | |
通讯作者 | Wang, Jingli; Chai, Yang; Xu, Cheng-Yan; Qin, Jing-Kai |
发表日期 | 2024-09-01
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DOI | |
发表期刊 | |
ISSN | 2520-1131
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摘要 | Integrated circuits based on two-dimensional semiconductors require ultrathin gate insulators that can provide high interface quality and dielectric reliability, minimized electrically active traps and efficient gate controllability. However, existing two-dimensional insulators do not provide a good trade-off in terms of bandgap, breakdown strength, dielectric constant, leakage current and bias temperature stability. Here, we show that single crystals of magnesium niobate (MgNb2O6) can be obtained through a buffer-controlled epitaxial growth process on a mica substrate. The atomically thin MgNb2O6 crystals have a wide bandgap (around 5.0 eV), high dielectric constant (around 20), large breakdown voltage (around 16 MV cm(-1)) and good thermal reliability. The MgNb2O6 can form a van der Waals interface with monolayer molybdenum disulfide (MoS2) with an extremely low density of trap states. MoS2 field-effect transistors with MgNb2O6 gate dielectrics exhibit a hysteresis under 0.9 mV (MV cm(-1))(-1), a subthreshold swing of 62 mV dec(-1), an on/off current ratio of up to 4 x 10(7) and high electrical reliability at 500 K. The excellent electrostatic controllability of MgNb2O6 allowed us to create graphene-contacted transistors and inverter circuits with a channel length of 50 nm. |
相关链接 | [来源记录] |
收录类别 | |
语种 | 英语
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学校署名 | 其他
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资助项目 | Shenzhen Science and Technology Innovation Commission["2022YFA1203802","2021YFB3601202"]
; National Key R&D Program of China["52102161","62204056"]
; National Natural Science Foundation of China["RCYX20221008092912045","RCJC20210706091950025","JCYJ20220530115204009"]
; Shenzhen Science and Technology Program[22YF1402700]
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WOS研究方向 | Engineering
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WOS类目 | Engineering, Electrical & Electronic
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WOS记录号 | WOS:001315604900003
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出版者 | |
来源库 | Web of Science
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引用统计 |
被引频次[WOS]:8
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成果类型 | 期刊论文 |
条目标识符 | http://sustech.caswiz.com/handle/2SGJ60CL/834221 |
专题 | 工学院_深港微电子学院 |
作者单位 | 1.Harbin Inst Technol Shenzhen, Sch Integrated Circuits, Shenzhen, Peoples R China 2.Harbin Inst Technol Shenzhen, Sch Mat Sci & Engn, Sauvage Lab Smart Mat, Shenzhen, Peoples R China 3.Fudan Univ, Frontier Inst Chip & Syst, State Key Lab Integrated Chips & Syst, Shanghai, Peoples R China 4.Fudan Univ, Sch Microelect, State Key Lab ASIC & Syst, Shanghai, Peoples R China 5.Hunan Univ, Coll Chem & Chem Engn, Hunan Prov Key Lab Two Dimens Mat, Changsha, Peoples R China 6.Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Peoples R China 7.Southern Univ Sci & Technol, Sch Microelect, Shenzhen, Peoples R China 8.Harbin Inst Technol, MOE Key Lab Microsyst & Microstruct Mfg, Harbin, Peoples R China 9.Shanghai Jiao Tong Univ, Dept Elect Engn, Shanghai, Peoples R China |
推荐引用方式 GB/T 7714 |
Zhu, Cheng-Yi,Zhang, Meng-Ru,Chen, Qing,et al. Magnesium niobate as a high-κ gate dielectric for two-dimensional electronics[J]. NATURE ELECTRONICS,2024.
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APA |
Zhu, Cheng-Yi.,Zhang, Meng-Ru.,Chen, Qing.,Yue, Lin-Qing.,Song, Rong.,...&Qin, Jing-Kai.(2024).Magnesium niobate as a high-κ gate dielectric for two-dimensional electronics.NATURE ELECTRONICS.
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MLA |
Zhu, Cheng-Yi,et al."Magnesium niobate as a high-κ gate dielectric for two-dimensional electronics".NATURE ELECTRONICS (2024).
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条目包含的文件 | 条目无相关文件。 |
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